Computer-readable Image Markers for Automated Registration in Correlative Microscopy – “autoCRIM” von Sheriff, J., Fletcher, I.W., Cumpson, P.J.

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The plasmonic properties of argon cluster-bombarded InP surfaces von Murdoch, B. J., Barlow, A. J., Fletcher, I. W., Cumpson, P. J.

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Analysis of the surface chemistry of oxidized polyethylene: comparison of XPS and ToF-SIMS von Briggs, D., Brewis, D. M., Dahm, R. H., Fletcher, I. W.

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Visible wavelength surface-enhanced Raman spectroscopy from In-InP nanopillars for biomolecule detection von Murdoch, B. J., Portoles, J. F., Tardio, S., Barlow, A. J., Fletcher, I. W., Cumpson, P. J.

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Multivariate image analysis strategies for ToF-SIMS images with topography von Lee, J. L. S., Gilmore, I. S., Fletcher, I. W., Seah, M. P.

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Evidence of specific interaction between γ-glycidoxypropyltrimethoxysilane and oxidized aluminium using high-mass resolution ToF-SIMS von Abel, Marie-Laure, Digby, Roger P., Fletcher, Ian W., Watts, John F.

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Topography and field effects in the quantitative analysis of conductive surfaces using ToF-SIMS von Lee, J.L.S., Gilmore, I.S., Fletcher, I.W., Seah, M.P.

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Surface modification and electrostatic charge of polystyrene particles von Cassidy, O.E, Rowley, G, Fletcher, I.W, Davies, S.F, Briggs, D

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Cs+ Ion Beam Damage of Poly(vinyl chloride) and Poly(methyl methacrylate) Studied by High Mass Resolution ToF-SIMS von Briggs, D., Fletcher, I. W.

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Direct imaging of plasma-polymerized chemical micropatterns von Bullett, N. A., Short, R. D., O'Leary, T., Beck, A. J., Douglas, C. W. I., Cambray-Deakin, M., Fletcher, I. W., Roberts, A., Blomfield, C.

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Positive secondary ion mass spectrum of poly(methyl methacrylate): a high mass resolution ToF-SIMS study von Briggs, David, Fletcher, Ian W., Gonçalves, Nancy M.

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Performance and application of the scienta ESCA300 spectrometer von Beamson, G., Briggs, D., Davies, S. F., Fletcher, I. W., Clark, D. T., Howard, J., Gelius, U., Wannberg, B., Balzer, P.

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Surface Characterization of Conducting Polymer-Silica Nanocomposites by X-ray Photoelectron Spectroscopy von Maeda, Shuichi, Gill, Michael, Armes, Steven P, Fletcher, Ian W

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Erratum: “Visible wavelength surface-enhanced Raman spectroscopy from In-InP nanopillars for biomolecule detection” [Appl. Phys. Lett. 109, 253105 (2016)] von Murdoch, B. J., Portoles, J. F., Tardio, S., Barlow, A. J., Fletcher, I. W., Cumpson, P. J.

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Smart water channelling through dual wettability by leaves of the bamboo Phyllostachys aurea von Wigzell, J.M., Racovita, R.C., Stentiford, B.G., Wilson, M., Harris, M.T., Fletcher, I.W., Mosquin, D.P.K., Justice, D., Beaumont, S.K., Jetter, R., Badyal, J.P.S.

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Surface modifications introduced to a polytetrafluorethylene-filled polycarbonate compound by dry sliding against steel as revealed by imaging XPS von Fletcher, I. W., Davies, M., Briggs, D.

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Characterization of polypyrrole-fibre composites by time-of-flight secondary ion mass spectrometry and vibrational spectroscopy von Hearn, M.J., Fletcher, I.W., Church, S.P., Armes, S.P.

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Surface Morphology of a PVC/PMMA Blend Studied by ToF-SIMS von Briggs, D., Fletcher, I. W., Reichlmaier, S., Agulo-Sanchez, J. L., Short, R. D.

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High-mass-resolution ToF-SIMS study of chlorine-containing polymers von Briggs, David, Fletcher, Ian W., Gonçalves, Nancy M.

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Interphase Formation and the Characterisation of Polymer/Ceramic Adhesion von Taylor, A. M., Watts, J. F., Duncan, H., Fletcher, I. W.

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