Towards easy and reliable AFM tip shape determination using blind tip reconstruction von Flater, Erin E., Zacharakis-Jutz, George E., Dumba, Braulio G., White, Isaac A., Clifford, Charles A.

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Error estimation and enhanced stiffness sensitivity in contact resonance force microscopy with a multiple arbitrary frequency lock-in amplifier (MAFLIA) von Flater, Erin E, Mugdha, Arya C, Gupta, Saurabh, Hudson, William A, Fahrenkamp, Abbigail A, Killgore, Jason P, Wilson, Jesse W

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Nanotribology of Octadecyltrichlorosilane Monolayers and Silicon:  Self-Mated versus Unmated Interfaces and Local Packing Density Effects von Flater, Erin E, Ashurst, W. Robert, Carpick, Robert W

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A simple atomic force microscope-based method for quantifying wear of sliding probes von Flater, Erin E., Barnes, Jared D., Hitz Graff, Jesse A., Weaver, Jayse M., Ansari, Naveed, Poda, Aimee R., Robert Ashurst, W., Khanal, Subarna R., Jacobs, Tevis D. B.

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In situ wear studies of surface micromachined interfaces subject to controlled loading von Flater, Erin E., Corwin, Alex D., de Boer, Maarten P., Carpick, Robert W.

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Using fundamental studies of friction to predict the performance of MEMS devices von Carpick, Robert W, Flater, Erin E, Street, Mark D, Bora, Can K, Plesha, Michael E, Corwin, Alex D, de Boer, Maarten P

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Contact mechanics description of inelastic displacement response of a nano-positioning device von Starr, M.J., Reedy, E.D., Corwin, A.D., Carpick, R.W., Flater, E.E.

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