Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons von Close, R., Chen, Z., Shibata, N., Findlay, S.D.

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Dynamics of annular bright field imaging in scanning transmission electron microscopy von Findlay, S.D., Shibata, N., Sawada, H., Okunishi, E., Kondo, Y., Ikuhara, Y.

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Detector non-uniformity in scanning transmission electron microscopy von Findlay, S.D., LeBeau, J.M.

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Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopy von Chen, Z., Weyland, M., Sang, X., Xu, W., Dycus, J.H., LeBeau, J.M., D'Alfonso, A.J., Allen, L.J., Findlay, S.D.

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Measuring nanometre-scale electric fields in scanning transmission electron microscopy using segmented detectors von Brown, H.G., Shibata, N., Sasaki, H., Petersen, T.C., Paganin, D.M., Morgan, M.J., Findlay, S.D.

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Factors limiting quantitative phase retrieval in atomic-resolution differential phase contrast scanning transmission electron microscopy using a segmented detector von Mawson, T., Taplin, D.J., Brown, H.G., Clark, L., Ishikawa, R., Seki, T., Ikuhara, Y., Shibata, N., Paganin, D.M., Morgan, M.J., Weyland, M., Petersen, T.C., Findlay, S.D.

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Energy dispersive X-ray analysis on an absolute scale in scanning transmission electron microscopy von Chen, Z., D'Alfonso, A.J., Weyland, M., Taplin, D.J., Allen, L.J., Findlay, S.D.

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Large angle illumination enabling accurate structure reconstruction from thick samples in scanning transmission electron microscopy von Brown, H.G., Ishikawa, R., S´anchez-Santolino, G., Shibata, N., Ikuhara, Y., Allen, L.J., Findlay, S.D.

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Enhanced light element imaging in atomic resolution scanning transmission electron microscopy von Findlay, S.D., Kohno, Y., Cardamone, L.A., Ikuhara, Y., Shibata, N.

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High contrast at low dose using a single, defocussed transmission electron micrograph von Clark, L., Petersen, T.C., Williams, T., Morgan, M.J., Paganin, D.M., Findlay, S.D.

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Practical aspects of diffractive imaging using an atomic-scale coherent electron probe von Chen, Z., Weyland, M., Ercius, P., Ciston, J., Zheng, C., Fuhrer, M.S., D'Alfonso, A.J., Allen, L.J., Findlay, S.D.

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Composition measurement in substitutionally disordered materials by atomic resolution energy dispersive X-ray spectroscopy in scanning transmission electron microscopy von Chen, Z., Taplin, D.J., Weyland, M., Allen, L.J., Findlay, S.D.

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The atomic structure of polar and non-polar InGaN quantum wells and the green gap problem von Humphreys, C.J., Griffiths, J.T., Tang, F., Oehler, F., Findlay, S.D., Zheng, C., Etheridge, J., Martin, T.L., Bagot, P.A.J., Moody, M.P., Sutherland, D., Dawson, P., Schulz, S., Zhang, S., Fu, W.Y., Zhu, T., Kappers, M.J., Oliver, R.A.

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Accuracy and precision of thickness determination from position-averaged convergent beam electron diffraction patterns using a single-parameter metric von Pollock, J.A., Weyland, M., Taplin, D.J., Allen, L.J., Findlay, S.D.

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Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopy von Dycus, J.H., Xu, W., Sang, X., D'Alfonso, A.J., Chen, Z., Weyland, M., Allen, L.J., Findlay, S.D., LeBeau, J.M.

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Lattice-resolution contrast from a focused coherent electron probe. Part I von Allen, L.J., Findlay, S.D., Oxley, M.P., Rossouw, C.J.

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Prospects for lithium imaging using annular bright field scanning transmission electron microscopy: A theoretical study von Findlay, S.D., Lugg, N.R., Shibata, N., Allen, L.J., Ikuhara, Y.

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Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, Part II: Inelastic scattering von D’Alfonso, A.J., Cosgriff, E.C., Findlay, S.D., Behan, G., Kirkland, A.I., Nellist, P.D., Allen, L.J.

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The effect of vacancies on the annular dark field image contrast of grain boundaries: A SrTiO3 case study von Lee, H.-S., Findlay, S.D., Mizoguchi, T., Ikuhara, Y.

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Volcano structure in atomic resolution core-loss images von D’Alfonso, A.J., Findlay, S.D., Oxley, M.P., Allen, L.J.

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