Deposition of In2O3SnO2 layers on glass substrates using a spraying method von Manifacier, J.C, Fillard, J.P, Bind, J.M

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Near field optical behaviour of C supertips von Castagné, M., Benfedda, M., Lahimer, S., Falgayrettes, P., Fillard, J.P.

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Optically stimulated luminescence and cathodoluminescence of MgS:Eu phosphors von Rao, R.P., Gasiot, J., Fillard, J.P.

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Optical non-desctructive tests for the evaluation of microprecipitates in semiconductors and devices von Fillard, J.P.

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A new approach to the similarity relations in the fuzzy set theory von Faurous, P., Fillard, J.P.

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A study of semiconductor surfaces and devices by coupled IR photon tunneling and atomic-force microscopy von Gall-Borrut, P., Castagne, M., Weyher, J.L., Fillard, J.P., Bonnafe, J.

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Investigations of oxygen precipitates in Czochralski silicon wafers by using infrared tomography von Fillard, J.P.

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Optical and electrical properties of SnO2 thin films in relation to their stoichiometric deviation and their crystalline structure von Manifacier, J.C., De Murcia, M., Fillard, J.P., Vicario, E.

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Electron injection in thin films of copper phtalocyanine von Delacote, G.M., Fillard, J.P., Marco, F.J.

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Qualification by optical means of CdTe substrates von Triboulet, R., Durand, A., Gall, P., Bonnafé, J., Fillard, J.P., Krawczyk, S.K.

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High resolution and sensitivity infrared tomography von Fillard, J.P., Montgomery, P.C., Gall, P., Castagné, M., Bonnafé, J.

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Photon tunneling from semiconductor surfaces to atomic force microscopy probes von Fillard, J.P., Castagné, M., Prioleau, C., Baudry, E., Gall, P., Bonnafé, J.

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Non-destructive optical inspection of evaporated fluoride glass layers von Montgomery, P.C., Montaner, D., Jacoboni, C., Boulard, B., Fillard, J.P.

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Fourier phase shift location estimation of unfocused optical point spread functions von Fillard, J.P, Lussert, J.M, Castagné, M, M'timet, H

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Submicron optical sectioning microscopy: A particular inverse problem solution adapted to epilayer defect analysis von Fillard, J.P., Montgomery, P.C., Gall, P., Bonnafé, J., Castagné, M.

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Short range association of EL2 with dislocations in GaAs-In materials von Fillard, J.P., Gall, P., Baroudi, A., Bonnafe, J.

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Inhomogeneity in a semi-insulating indium phosphide ingot von L'Haridon, H., Callec, R., Coquillé, R., Favennec, P.N., Fillard, J.P., Gall, P., Gauneau, M., Le Guillou, Y.

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Electrical conductivity and space charge Cu 2O von Charles, J.P., Fillard, J.P.

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An analysis of the oxygen condensation processes in silicon by laser-scanning tomography von Gall, P., Bonnafé, J., Fillard, J.P., Lemme, R., Fazekas, J.

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Thermally stimulated currents in Cu 2O von Fillard, J.P., Gasiot, J.

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