The Limits of X-ray Diffraction Theory von Fewster, Paul F.

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X-ray scattering from semiconductors and other materials von Fewster, Paul F

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Estimating the structure factors in X‐ray diffraction von Fewster, Paul F.

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Response to Fraser & Wark's comments on A new theory for X‐ray diffraction von Fewster, Paul F.

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What is an `ideally imperfect' crystal? Is kinematical theory appropriate? von Fewster, Paul F.

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A new theory for X‐ray diffraction von Fewster, Paul F.

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X-ray analysis of thin films and multilayers von Fewster, Paul F

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High-resolution X-ray diffraction and imaging von Fewster, Paul F., Baidakova, Marina V., Kyutt, Reginald

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A compact high-resolution X-ray powder diffractometer von Fewster, Paul F., Trout, David R. D.

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X‐ray investigation of lateral hetero‐structures of inversion domains in LiNbO3, KTiOPO4 and KTiOAsO4 von Lyford, Thomas S., Collins, Stephen P., Fewster, Paul F., Thomas, Pamela A.

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Crystal truncation rod X-ray scattering: exact dynamical calculation von Holý, Václav, Fewster, Paul F.

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A `static' high-resolution X-ray diffractometer von Fewster, Paul F.

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A `beam-selection' high-resolution X-ray diffractometer von Fewster, Paul F.

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An icy mineralogy package (IMP) for in-situ studies of Titan’s surface von Fortes, A. Dominic, Wood, Ian G., Dobson, David P., Fewster, Paul F.

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Advances in the structural characterisation of semiconductor crystals by X-ray scattering methods von Fewster, Paul F.

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The simulation and interpretation of diffraction profiles from partially relaxed layer structures von Fewster, P. F.

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X-ray investigation of lateral hetero-structures of inversion domains in LiNbO 3 , KTiOPO 4 and KTiOAsO 4 von Lyford, Thomas S., Collins, Stephen P., Fewster, Paul F., Thomas, Pamela A.

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X-ray investigation of lateral hetero-structures of inversion domains in LiNbO sub(3), KTiOPO sub(4) and KTiOAsO sub(4) von Lyford, Thomas S, Collins, Stephen P, Fewster, Paul F, Thomas, Pamela A

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Crystal truncation rod X-ray scattering: exact dynamical calculation von Holy, Vaclav, Fewster, Paul F

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Instruments for Measuring Scattering Patterns von Paul F Fewster

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