X-ray diffraction from low-dimensional structures von Fewster, P F

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High-mobility thin InSb films grown by molecular beam epitaxy von Zhang, T., Clowes, S. K., Debnath, M., Bennett, A., Roberts, C., Harris, J. J., Stradling, R. A., Cohen, L. F., Lyford, T., Fewster, P. F.

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Absolute Lattice-Parameter Measurement von Fewster, P. F., Andrew, N. L.

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Dynamical diffraction in layered systems - a quest for the final formula von Holý, V, Fewster, P F

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Composition determination in quantum dots with in-plane scattering compared with STEM and EDX analysis von Fewster, P F, Holý, V, Zhi, D

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A high-resolution multiple-crystal multiple-reflection diffractometer von Fewster, P. F.

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Reciprocal space mapping von Fewster, Paul F.

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SiGe quantum cascade structures for light emitting devices von Zhang, J., Li, X.B., Neave, J.H., Norris, D.J., Cullis, A.G., Kelsall, R.W., Lynch, S., Towsend, P., Paul, D.J., Fewster, P.F.

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GSMBE growth and structural characterisation of SiGeC layers for HBT von Zhang, J., Neave, J.H., Li, X.B., Fewster, P.F., El Mubarek, H.A.W., Ashburn, P., Mitrovic, I.Z., Buiu, O., Hall, S.

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Applications and new developments in X-ray materials analysis with MEDIPIX2 von Bethke, K., Vries, R. de, Kogan, V., Vasterink, J., Verbruggen, R., Kidd, P., Fewster, P., Bethke, J.

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Determination of the Mn concentration in GaMnAs von Zhao, L X, Campion, R P, Fewster, P F, Martin, R W, Ber, B Ya, Kovarsky, A P, Staddon, C R, Wang, K Y, Edmonds, K W, Foxon, C T, Gallagher, B L

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Evidence for dislocation-related amphoteric behaviour of Si dopant in high-mobility InSb thin films von Zhang, T, Harris, J J, Clowes, S K, Debnath, M, Bennett, A, Cohen, L F, Lyford, T, Fewster, P F

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Interpretation of the diffraction profile resulting from strain relaxation in epilayers von Kidd, P, Fewster, P F, Andrew, N L

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Absolute lattice parameter measurement von Fewster, P F

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Composition and lattice-mismatch measurement of thin semiconductor layers by x-ray diffraction von FEWSTER, P. F, CURLING, C. J

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Combining high-resolution X-ray diffractometry and topography von Fewster, P. F.

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Microstructure and composition analysis of group III nitrides by X-ray scattering von Fewster, P.F., Andrew, N.L., Foxon, C.T.

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Measuring strain in polycrystalline CVD diamond films von Golshan, M, Laundy, D, Fewster, P F, Moore, M, Whitehead, A, Butler, J E, Konovalov, O

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The simulation and interpretation of diffraction profiles from partially relaxed layer structures von Fewster, P. F.

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Manuscript, Voice, and the Construction of Pseudepigraphal Identities: Composing a Mutable David in Some Qumran Psalms Scrolls von Fewster, Gregory Peter

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