First measurement of the in-pixel electron multiplying with a standard imaging CMOS technology: Study of the EMCMOS concept von Brugière, Timothée, Mayer, Fréderic, Fereyre, Pierre, Guérin, Cyrille, Dominjon, Agnés, Barbier, Rémi

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A Theory of Multiplication Noise for Electron Multiplying CMOS Image Sensors von Brugière, Timothée, Mayer, Frederic, Fereyre, Pierre, Dominjon, Agnes, Barbier, Remi

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Gamma and Proton-Induced Dark Current Degradation of 5T CMOS Pinned Photodiode 0.18~\mu\hbox CMOS Image Sensors von Martin, E., Nuns, T., David, J.-P, Gilard, O., Vaillant, J., Fereyre, P., Prevost, V., Boutillier, M.

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Gamma and Proton-Induced Dark Current Degradation of 5T CMOS Pinned Photodiode 0.18 ~ mu hbox m CMOS Image Sensors von Martin, E, Nuns, T, David, J-P, Gilard, O, Vaillant, J, Fereyre, P, Prevost, V, Boutillier, M

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Gamma and Proton-Induced Dark Current Degradation of 5T CMOS Pinned Photodiode [Formula Omitted] CMOS Image Sensors von Martin, E, Nuns, T, David, J.-P, Gilard, O, Vaillant, J, Fereyre, P, Prevost, V, Boutillier, M

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