Compact Modeling of MOSFET I – V Characteristics and Simulation of Dose-Dependent Drain Currents von Zebrev, Gennady I., Orlov, Vasily V., Bakerenkov, Alexander S., Felitsyn, Vladislav A.

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ELDRS Susceptibility of Bipolar Transistors and Integrated Circuits During Low-Temperature Irradiation von Bakerenkov, Alexander S., Pershenkov, Viacheslav S., Felitsyn, Vladislav A., Rodin, Alexander S., Telets, Vitaly A., Belyakov, Vladimir V., Shurenkov, Vladimir V.

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Enhanced low dose rate sensitivity (ELDRS) and reduced low dose rate sensitivity (RLDRS) in bipolar devices von Pershenkov, Vyacheslav, Bakerenkov, Alexander, Rodin, Alexander, Felitsyn, Vladislav, Zhukov, Alexander, Telets, Vitaly, Belyakov, Vladimir

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Effect of Temperature and Electrical Modes on Radiation Sensitivity of MISFET Dose Sensors von Boris Podlepetsky, Viacheslav Pershenkov, Alexander Bakerenkov, Vladislav Felitsyn, Alexander Rodin

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TEST OBJECT THERMAL STABILISATION APPARATUS von Anashin Vasilij Sergeevich, Rodin Aleksandr Sergeevich, Bakerenkov Aleksandr Sergeevich, Matyugin Nikolaj Nikolaevich, Felitsyn Vladislav Aleksandrovich

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