An Acoustic Microscope for Industrial Applications von Smith, I.R., Harvey, R.A., Fathers, D.J.

Volltext

UHV-SEM studies of surface processes: Recent progress von Venebles, J.A., Spiller, G.D.T., Fathers, D.J., Harland, C.J., Hanbücken, M.

Volltext

Methods of observing magnetic domains by scanning electron microscopy von Fathers, D.J., Jakubovics, J.P.

Volltext