Automated thermal fuse inspection using machine vision and artificial neural networks von Sun, Te-Hsiu, Tien, Fang-Cheng, Tien, Fang-Chih, Kuo, Ren-Jieh

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Automatic Reclaimed Wafer Classification Using Deep Learning Neural Networks von Shih, Po-Chou, Hsu, Chun-Chin, Tien, Fang-Chih

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Integrate weighted dependence and skewness based multiblock principal component analysis with Bayesian inference for large-scale process monitoring von Hsu, Chun-Chin, Shih, Po-Chou, Tien, Fang-Chih

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Steel ball surface inspection using modified DRAEM and machine vision von Hsu, Chun-Chin, Hsu, Ya-Chen, Shih, Po-Chou, Yang, Yong-Qi, Tien, Fang-Chih

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Post-Slicing Inspection of Silicon Wafers Using the HJ-PSO Algorithm Under Machine Vision von SUN, Te-Hsiu, TANG, Chung-Hao, TIEN, Fang-Chih

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Self-organizing feature maps for solving location–allocation problems with rectilinear distances von Hsieh, Kuang-Han, Tien, Fang-Chih

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Using Eigenvalues of Covariance Matrices for Automated Visual Inspection of Microdrills von Tien, Fang-Chih, Yeh, Chi-Hao

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Using backpropagation neural network for face recognition with 2D + 3D hybrid information von Sun, Te-Hsiu, Tien, Fang-Chih

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A single-featured EWMA-X control chart for detecting shifts in process mean and standard deviation von Liu, Chi-Shuan, Tien, Fang-Chih

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Development of an XML-based structural product retrieval system for virtual enterprises von Tsai, Chieh-Yuan, Tien, Fang-Chih, Pan, Tsung-Yu

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Invariant 2D object recognition using eigenvalues of covariance matrices, re-sampling and autocorrelation von Sun, Te-Hsiu, Liu, Chi-Shuan, Tien, Fang-Chih

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Face recognition using 2D and disparity eigenface von Sun, Te-Hsiu, Chen, Mingchih, Lo, Shuchuan, Tien, Fang-Chih

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Boundary-based corner detection using K-cosine von Te-Hsiu Sun, Chih-Chung Lo, Po-Shen Yu, Fang-Chih Tien

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Boundary-based passive component inspection approach using eigenvalues of covariance matrices von Yeh, Chi-Hao, Tien, Fang-Chih, Wu, Ful-Chiang

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Applying Particle Swarm Optimization algorithm to roundness measurement von Chun-Yuan Cheng, Chih-Chung Lo, Chien-Yu Chiang, Fang Chih Tien

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Roundness measurement using the PSO algorithm von Te-Hsiu Sun, Chun-Yuan Cheng, Fang-Chih Tien

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Neural networks for precise measurement in computer vision systems von Su, Chao-Ton, Chang, C.Alec, Tien, Fang-Chih

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WITHDRAWN: Self-organizing feature maps for solving location-allocation problems with rectilinear distances von Hsieh, Kuang-Han, Tien, Fang-Chih

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Simple method for sampling mucus adhered to nasal mucosa surface and test kit for detecting analyte in sample von MIYAZAWA, TAKASHI, TIEN, CHIH-FANG

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Light-homogenizing imaging device for a bead sorting machine von TIEN, FANG CHIH, HSU, YA CHEN

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