Deep traps in AlGaN/GaN heterostructures studied by deep level transient spectroscopy: Effect of carbon concentration in GaN buffer layers von Fang, Z.-Q., Claflin, B., Look, D. C., Green, D. S., Vetury, R.

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Selective adsorption of Cr(VI) from aqueous solution by EDA-Fe3O4 nanoparticles prepared from steel pickling waste liquor von Fang, X.B., Fang, Z.Q., Tsang, P.K.E., Cheng, W., Yan, X.M., Zheng, L.C.

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Electrical characterization and deep-level transient spectroscopy of Ge0.873Si0.104Sn0.023 photodiode grown on Ge platform by ultra-high vacuum chemical vapor deposition von Wang, Buguo, Fang, Z.-Q., Claflin, Bruce, Look, David, Kouvetakis, John, Yeo, Yung Kee

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First report of bacterial soft rot on Epipremnum aureum caused by Pectobacterium aroidearum in Taiwan von Wang, Liang-Hsuan, Tang, Wen-Qian, Chan, Jiun-Jie, Lee, Yi-Jin, Chang, Ching-Yu, Fang, Zi-Qing, Chu, Chia-Ching

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Identification of donors, acceptors, and traps in bulk-like HVPE GaN von Look, D.C., Fang, Z.-Q., Claflin, B.

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A new algorithm for contact detection between spherical particle and triangulated mesh boundary in discrete element method simulations von Hu, L., Hu, G.M., Fang, Z.Q., Zhang, Y.

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First Report of Xanthomonas axonopodis pv. begoniae Causing Bacterial Leaf Spot on Rieger Begonias in Taiwan von Lin, F.-Y., Fang, Z.-Q., Lee, S., Wang, Y.-H., Lin, Y.-R., Chu, C.-C.

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Gene expression profile and enrichment pathways in different stages of bladder cancer von Fang, Z-Q, Zang, W-D, Chen, R, Ye, B-W, Wang, X-W, Yi, S-H, Chen, W, He, F, Ye, G

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Defects at oxygen plasma cleaned ZnO polar surfaces von Dong, Yufeng, Fang, Z.-Q., Look, D. C., Doutt, D. R., Cantwell, G., Zhang, J., Song, J. J., Brillson, Leonard J.

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Enhanced Electrokinetic Remediation of Copper-Contaminated Soils near a Mine Tailing Using the Approaching-Anode Technique von Cai, Z. P, Chen, D. R, Fang, Z. Q, Xu, M. Q, Li, W. S

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Kinking of an interface crack in an orthotropic bimaterial von Cui, C. B., Beom, H. G., Jang, H. S., Fang, Q.-Z., Li, H. M.

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Deep level characteristics in n-GaN with inductively coupled plasma damage von Cho, H K, Khan, F A, Adesida, I, Fang, Z-Q, Look, D C

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Interplay of native point defects with ZnO Schottky barriers and doping von Brillson, Leonard J., Dong, Yufeng, Tuomisto, Filip, Svensson, Bengt G., Kuznetsov, Andrei Yu, Doutt, Daniel, Mosbacker, H. Lee, Cantwell, Gene, Zhang, Jizhi, Song, Jin Joo, Fang, Z.-Q., Look, David C.

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Effects of electron-irradiation on electrical properties of AlGaN/GaN Schottky barrier diodes von Fang, Z.-Q., Farlow, G. C., Claflin, B., Look, D. C., Green, D. S.

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Native point defects at ZnO surfaces, interfaces and bulk films von Brillson, Leonard J., Dong, Y., Tuomisto, F., Svensson, B. G., Kuznetsov, A. Yu, Doutt, D., Mosbacker, H. L., Cantwell, G., Zhang, J., Song, J. J., Fang, Z.-Q., Look, D. C.

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Massive point defect redistribution near semiconductor surfaces and interfaces and its impact on Schottky barrier formation von Brillson, L.J., Dong, Y., Doutt, D., Look, D.C., Fang, Z.-Q.

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Traps in AlGaN ∕ GaN ∕ SiC heterostructures studied by deep level transient spectroscopy von Fang, Z.-Q., Look, D. C., Kim, D. H., Adesida, I.

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Deep Traps in AlGaN/GaN Heterostructure Field-Effect Transistors Studied by Current-Mode Deep-Level Transient Spectroscopy: Influence of Device Location von Fang, Z.-Q., Claflin, B., Look, D.C.

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Effects of annealing in N2 ambient on traps and persistent conduction in hydrothermally grown ZnO von Fang, Z.-Q., Claflin, B., Look, D. C.

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Traps in 4H-SiC Field-Effect Transistors Characterized by Capacitance- and Current-Mode Deep-Level Transient Spectroscopy von Fang, Z.-Q., Claflin, B., Look, D. C., Chai, F., Odekirk, B.

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