Characterization of Glaucoma Medication Adherence in Kaiser Permanente Southern California von Jones, Jason P, Fong, Donald S, Fang, Ervin N, Mesirov, Claire A, Patel, Vaishali

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The prevalence of glaucomatous risk factors in patients from a managed care setting: a pilot evaluation von Fang, Ervin N, Law, Simon K, Walt, John G, Chiang, Tina H, Williams, Erin N

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Increased Intraocular Pressure After Cataract Surgery von Fang, Ervin N., Kass, Michael A.

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The Prevalence of Neurologic Dysfunction in Children with Strabismus Who Have Superior Oblique Overaction von Hamed, Latif M., Fang, Ervin N., Fanous, Maher M., Maria, Bernard L., McGorray, Susan P., Rosen, Bradley S., Cassin, Barbara

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PIXL: Planetary Instrument for X-Ray Lithochemistry von Allwood, Abigail C., Wade, Lawrence A., Foote, Marc C., Elam, William Timothy, Hurowitz, Joel A., Battel, Steven, Dawson, Douglas E., Denise, Robert W., Ek, Eric M., Gilbert, Martin S., King, Matthew E., Liebe, Carl Christian, Parker, Todd, Pedersen, David A. K., Randall, David P., Sharrow, Robert F., Sondheim, Michael E., Allen, George, Arnett, Kenneth, Au, Mitchell H., Basset, Christophe, Benn, Mathias, Bousman, John C., Braun, David, Calvet, Robert J., Clark, Benton, Cinquini, Luca, Conaby, Sterling, Conley, Henry A., Davidoff, Scott, Delaney, Jenna, Denver, Troelz, Diaz, Ernesto, Doran, Gary B., Ervin, Joan, Evans, Michael, Flannery, David O., Gao, Ning, Gross, Johannes, Grotzinger, John, Hannah, Brett, Harris, Jackson T., Harris, Cathleen M., He, Yejun, Heirwegh, Christopher M., Hernandez, Christina, Hertzberg, Eric, Hodyss, Robert P., Holden, James R., Hummel, Christopher, Jadusingh, Matthew A., Jørgensen, John L., Kawamura, Jonathan H., Kitiyakara, Amarit, Kozaczek, Kris, Lambert, James L., Lawson, Peter R., Liu, Yang, Luchik, Thomas S., Macneal, Kristen M., Madsen, Soren N., McLennan, Scott M., McNally, Patrick, Meras, Patrick L., Muller, Richard E., Napoli, Jamie, Naylor, Bret J., Nemere, Peter, Ponomarev, Igor, Perez, Raul M., Pootrakul, Napat, Romero, Raul A., Rosas, Rogelio, Sachs, Jared, Schaefer, Rembrandt T., Schein, Michael E., Setterfield, Timothy P., Singh, Vritika, Song, Eugenie, Soria, Mary M., Stek, Paul C., Tallarida, Nicholas R., Thompson, David R., Tice, Michael M., Timmermann, Lars, Torossian, Violet, Treiman, Allan, Tsai, Shihchuan, Uckert, Kyle, Villalvazo, Juan, Wang, Mandy, Wilson, Daniel W., Worel, Shana C., Zamani, Payam, Zappe, Mike, Zhong, Fang, Zimmerman, Richard

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Correction to: PIXL: Planetary Instrument for X-Ray Lithochemistry von Allwood, Abigail C., Wade, Lawrence A., Foote, Marc C., Elam, William Timothy, Hurowitz, Joel A., Battel, Steven, Dawson, Douglas E., Denise, Robert W., Ek, Eric M., Gilbert, Martin S., King, Matthew E., Liebe, Carl Christian, Parker, Todd, Pedersen, David A. K., Randall, David P., Sharrow, Robert F., Sondheim, Michael E., Allen, George, Arnett, Kenneth, Au, Mitchell H., Basset, Christophe, Benn, Mathias, Bousman, John C., Braun, David, Calvet, Robert J., Clark, Benton, Cinquini, Luca, Conaby, Sterling, Conley, Henry A., Davidoff, Scott, Delaney, Jenna, Denver, Troelz, Diaz, Ernesto, Doran, Gary B., Ervin, Joan, Evans, Michael, Flannery, David T., Gao, Ning, Gross, Johannes, Grotzinger, John, Hannah, Brett, Harris, Jackson T., Harris, Cathleen M., He, Yejun, Heirwegh, Christopher M., Hernandez, Christina, Hertzberg, Eric, Hodyss, Robert P., Holden, James R., Hummel, Christopher, Jadusingh, Matthew A., Jørgensen, John L., Kawamura, Jonathan H., Kitiyakara, Amarit, Kozaczek, Kris, Lambert, James L., Lawson, Peter R., Liu, Yang, Luchik, Thomas S., Macneal, Kristen M., Madsen, Soren N., McLennan, Scott M., McNally, Patrick, Meras, Patrick L., Muller, Richard E., Napoli, Jamie, Naylor, Bret J., Nemere, Peter, Ponomarev, Igor, Perez, Raul M., Pootrakul, Napat, Romero, Raul A., Rosas, Rogelio, Sachs, Jared, Schaefer, Rembrandt T., Schein, Michael E., Setterfield, Timothy P., Singh, Vritika, Song, Eugenie, Soria, Mary M., Stek, Paul C., Tallarida, Nicholas R., Thompson, David R., Tice, Michael M., Timmermann, Lars, Torossian, Violet, Treiman, Allan, Tsai, Shihchuan, Uckert, Kyle, Villalvazo, Juan, Wang, Mandy, Wilson, Daniel W., Worel, Shana C., Zamani, Payam, Zappe, Mike, Zhong, Fang, Zimmerman, Richard

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Scaling deep trench based eDRAM on SOI to 32nm and Beyond von Wang, G., Anand, D., Butt, N., Cestero, A., Chudzik, M., Ervin, J., Fang, S., Freeman, G., Ho, H., Khan, B., Kim, B., Kong, W., Krishnan, R., Krishnan, S., Kwon, O., Liu, J., McStay, K., Nelson, E., Nummy, K., Parries, P., Sim, J., Takalkar, R., Tessier, A., Todi, R.M., Malik, R., Stiffler, S., Iyer, S.S.

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A 0.039um2 high performance eDRAM cell based on 32nm High-K/Metal SOI technology von Butt, N, Mcstay, K, Cestero, A, Ho, H, Kong, W, Fang, S, Krishnan, R, Khan, B, Tessier, A, Davies, W, Lee, S, Zhang, Y, Johnson, J, Rombawa, S, Takalkar, R, Blauberg, A, Hawkins, K V, Liu, J, Rosenblatt, S, Goyal, P, Gupta, S, Ervin, J, Li, Z, Galis, S, Barth, J, Yin, M, Weaver, T, Li, J H, Narasimha, S, Parries, P, Henson, W K, Robson, N, Kirihata, T, Chudzik, M, Maciejewski, E, Agnello, P, Stiffler, S, Iyer, S S

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