Computing the Bidirectional Scattering of a Microstructure Using Scalar Diffraction Theory and Path Tracing von Falster, V., Jarabo, A., Frisvad, J. R.

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Microstructure Control in 3D Printing with Digital Light Processing von Luongo, A., Falster, V., Doest, M. B., Ribo, M. M., Eiriksson, E. R., Pedersen, D. B., Frisvad, J. R.

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Correcting the errors from variable sea salt retention and water of hydration in loss on ignition analysis: Implications for studies of estuarine and coastal waters von Stavn, Robert H., Rick, Hans J., Falster, Alexander V.

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Process for preparing low defect density silicon using high growth rates von R. J. FALSTER,V. VORONKOV

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Process for preparing defect free silicon crystal which allows for variability in process conditions von R.J. FALSTER,V. VORONKOV,P. MADY

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Minority carrier lifetime in silicon photovoltaics: The effect of oxygen precipitation von Murphy, J.D., McGuire, R.E., Bothe, K., Voronkov, V.V., Falster, R.J.

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Revisiting the role of mean annual precipitation in shaping functional trait distributions at a continental scale von Towers, Isaac R., Vesk, Peter A., Wenk, Elizabeth H., Gallagher, Rachael V., Windecker, Saras M., Wright, Ian J., Falster, Daniel S.

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Modern aridity in the Altai-Sayan mountain range derived from multiple millennial proxies von Churakova-Sidorova, Olga V., Myglan, Vladimir S., Fonti, Marina V., Naumova, Oksana V., Kirdyanov, Alexander V., Kalugin, Ivan A., Babich, Valery V., Falster, Georgina M., Vaganov, Eugene A., Siegwolf, Rolf T. W., Saurer, Matthias

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Latent complexes of interstitial boron and oxygen dimers as a reason for degradation of silicon-based solar cells von Voronkov, V. V., Falster, R.

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The effect of oxide precipitates on minority carrier lifetime in n -type silicon von Murphy, J. D., Al-Amin, M., Bothe, K., Olmo, M., Voronkov, V. V., Falster, R. J.

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Globally coherent water cycle response to temperature change during the past two millennia von Konecky, Bronwen L., McKay, Nicholas P., Falster, Georgina M., Stevenson, Samantha L., Fischer, Matt J., Atwood, Alyssa R., Thompson, Diane M., Jones, Matthew D., Tyler, Jonathan J., DeLong, Kristine L., Martrat, Belen, Thomas, Elizabeth K., Conroy, Jessica L., Dee, Sylvia G., Jonkers, Lukas, Churakova (Sidorova), Olga V., Kern, Zoltán, Opel, Thomas, Porter, Trevor J., Sayani, Hussein R., Skrzypek, Grzegorz

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Generation and loss of hydrogen-boron pairs in fired silicon wafers von Voronkov, V.V., Falster, R.

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Parameterisation of injection-dependent lifetime measurements in semiconductors in terms of Shockley-Read-Hall statistics: An application to oxide precipitates in silicon von Murphy, J. D., Bothe, K., Krain, R., Voronkov, V. V., Falster, R. J.

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Formation, dissociation, and diffusion of various hydrogen dimers in silicon von Voronkov, Vladimir V., Falster, Robert

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Properties of Hydrogen Species in n‐Type Silicon Deduced from In‐Diffusion Profiles von Voronkov, Vladimir V., Falster, Robert

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Functional diversity of the Australian flora: Strong links to species richness and climate von Andrew, Samuel C., Mokany, Karel, Falster, Daniel S., Wenk, Elizabeth, Wright, Ian J., Merow, Cory, Adams, Vanessa, Gallagher, Rachael V., Maria Sabatini, Francesco

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Effect of rapid thermal annealing on recombination centres in boron-doped Czochralski-grown silicon von Walter, D. C., Lim, B., Bothe, K., Voronkov, V. V., Falster, R., Schmidt, J.

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Patterns and drivers of plant diversity across Australia von Mokany, Karel, McCarthy, James K., Falster, Daniel S., Gallagher, Rachael V., Harwood, Thomas D., Kooyman, Robert, Westoby, Mark

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Ten (mostly) simple rules to future‐proof trait data in ecological and evolutionary sciences von Keller, Alexander, Ankenbrand, Markus J., Bruelheide, Helge, Dekeyzer, Stefanie, Enquist, Brian J., Erfanian, Mohammad Bagher, Falster, Daniel S., Gallagher, Rachael V., Hammock, Jennifer, Kattge, Jens, Leonhardt, Sara D., Madin, Joshua S., Maitner, Brian, Neyret, Margot, Onstein, Renske E., Pearse, William D., Poelen, Jorrit H., Salguero‐Gomez, Roberto, Schneider, Florian D., Tóth, Anikó B., Penone, Caterina

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On the mechanism of recombination at oxide precipitates in silicon von Murphy, J. D., Bothe, K., Voronkov, V. V., Falster, R. J.

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