Role of secondary ion mass spectrometric analysis in the brazing of precious alloys von Piccirillo, C., Fabrizio, M., Daolio, S., Facchin, B.

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Investigation on the formation of RuO2 film electrode by secondary ion mass spectrometry von KRISTOF, J, DAOLIO, S, PICCIRILLO, C, FACCHIN, B, MINK, J

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Secondary ion mass spectrometric studies on the formation mechanism of IrO2/TiO2-based coatings von Kristóf, J., Daolio, S., Piccirillo, C., Facchin, B., Pagura, C.

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Glass Sample Characterization by Secondary Ion Mass Spectrometry von Daolio, S., Piccirillo, C., Pagura, C., Facchin, B., Zecchin, S., Verità, M.

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Study of ZrO2 Film Evolution by Secondary Ion Mass Spectrometry von Daolio, S., Kristóf, J., Piccirillo, C., Gelosi, S., Facchin, B., Pagura, C.

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SIMS methods in reactivity studies on metal oxides von Daolio, S., Facchin, B., Pagura, C., De Battisti, A., Gelosi, S.

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Sims Characterization of Noble Metal-Based Thin Film Electrodes von Daolio, S., Pagura, C., Gelosi, S., Kristof, J., Facchin, B., Piccirillo, Clara

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Mass spectrometric techniques in the study of rare earth compounds von Daolio, S., Facchin, B., Pagura, C., Vigato, P.A.

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Ultraviolet functionalization of poly[bis(4-isopropylphenoxy)]phosphazene surfaces: An infrared and a sims study von Minto, F., Gleria, M., Bortolus, P., Daolio, S., Facchin, B., Pagura, C., Bolognesi, A.

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Mixed-Oxide electrode study by secondary ion mass spectrometry von Daolio, S., Facchin, B., Pagura, C., De Battisti, A., Battaglin, G.

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Secondary ion mass spectrometry in the study of lanthanide compounds von Daolio, S., Facchin, B., Pagura, C., Guerriero, P., Sitran, S., Vigato, P.A.

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Quadrupole secondary ion mass spectrometer for simultaneous detection of positive and negative ions von Daolio, S., Facchin, B., Pagura, C., Tolstogouzov, A., Konenkov, N.

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Secondary ion mass spectrometry studies on the formation of the valve metal oxide in ruthenium- and iridium-based mixed oxide electrodes von Daolio, S., Kristóf, J., Piccirillo, C., Facchin, B., Pagura, C.

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Investigation on the formation of RuO 2 film electrode by secondary ion mass spectrometry von Kristóf, J., Daolio, S., Piccirillo, C., Facchin, B., Mink, J.

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Influence of support material on formation of electrocatalytic thin films—a secondary ion mass spectrometry study von Piccirillo, C., Daolio, S., Kristóf, J., Mihály, J., Facchin, B., Fabrizio, M.

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Secondary ion mass spectrometric studies on the formation mechanism of IrO 2 /TiO 2 ‐based coatings von Kristóf, J., Daolio, S., Piccirillo, C., Facchin, B., Pagura, C.

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A Nier—Johnson secondary ion mass spectrometer for electrode surface study and electrochemical product characterizations von Daolio, S., Facchin, B., Pagura, C.

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Secondary-ion mass spectrometry methodology and surface chemistry of mixed oxide electrodes: Modifications induced by noble-metal content von Daolio, Sergio, Facchin, Bruno, Pagura, Cesare, De Battisti, Achille, Barbieri, Andrea

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Surface chemical changes of mixed-oxide films in Cl2 anodic production von Daolio, Sergio, Facchin, Bruno, Pagura, Cesare, Battisti, Achille De, Barbieri, Andrea

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Investigation of the Oxidative-Pyrolysis Processes of RuCl3 · xH2O and IrCl3 · xH2O von Nanni, L., De Battisti, A., Daolio, S., Facchin, B., Paguera, C.

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