Influence of metal impurities on leakage current of Si N+P diode von MIYAZAKI, M, SANO, M, SUMITA, S, FUJINO, N

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Transmission electron microscopy observation of defects induced by Fe contamination on Si(100) surface von SADAMITSU, S, SASAKI, A, HOURAI, M, SUMITA, S, FUJINO, N

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Behavior of defects induced by metallic impurities on Si(100) surfaces von HOURAI, M, MURAKAMI, K, SHIGEMATSU, T, FUJINO, N, SHIRAIWA, T

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Degradation of gate oxide integrity by metal impurities von HIRAMOTO, K, SANO, M, SADAMITSU, S, FUJINO, N

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A method of quantitative contamination with metallic impurities of the surface of a silicon wafer von HOURAI, M, NARIDOMI, T, OKA, Y, MURAKAMI, K, SUMITA, S, FUJINO, N, SHIRAIWA, T

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A model of thermal transfer in Czochralski silicon molten von YAMASHITA, K, KITAGAWA, K, AOKI, T, KAJITA, E, FUJINO, N, SHIRAIWA, T

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TEM observation of defects induced by Cu contamination on Si(100) surface von SADAMITSU, S, SUMITA, S, FUJINO, N, SHIRAIWA, T

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Comparison of gettering techniques by means of intentional quantitative Cu contamination von SANO, M, HORAI, M, MIYAZAKI, M, FUJINO, N, SHIRAIWA, T

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TEM Observation of Defects Induced by Ni Contamination on a Si(100) Surface von Sadamitsu, Shinsuke, Sano, Masakazu, Hourai, Masataka, Sumita, Shigeo, Fujino, Nobukatsu, Shiraiwa, Toshio

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Dependence of Gettering Efficiency on Metal Impurities von Miyazaki, Morimasa, Sano, Masakazu, Sadamitsu, Shinsuke, Sumita, Shigeo, Fujino, Nobukatsu, Shiraiwa, Toshio

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Influence of Combined Water and Fe(II) on Determination of Total Iron in Iron Ores by X-ray Fluorescence Analysis von Matsumoto, Yoshiro, Fujino, Nobukatsu, Nasu, Saburo

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Theoretical Calculation of Fluorescent X-Ray Intensities in Fluorescent X-Ray Spectrochemical Analysis von Shiraiwa, Toshio, Fujino, Nobukatsu

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Surface Analysis of Silicon Wafer von FUJINO, Nobukatsu, SUMITA, Shigeo

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On-line Analyzer for Ni–Zn Alloy Electroplated Coating on Steel von Matsumoto, Yoshiro, Fujino, Nobukatsu, Shibuya, Atsuyoshi, Nakahara, Hideyoku, Nakase, Ikuo, Koizumi, Akihiro

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On-line analyzer for Ni-Zn alloy electroplating bath von Matsumoto, Yoshiro, Fujino, Nobukatsu, Shibuya, Atsuyoshi, Nakahara, Hideyoku, Nakase, Ikuo, Koizumi, Akihiro

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Quantitative Electron Probe Microanalysis of Oxygen von Shiraiwa, Toshio, Fujino, Nobukatsu

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Theoretical correction procedures for X-ray fluorescence analysis von Shiraiwa, Toshio, Fujino, Nobukatsu

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Determination of metallic impurities on the surface of silicon wafers von TANIZOE, Yasuko, SUMITA, Shigeo, SANO, Masakazu, FUJINO, Nobukatsu, SHIRAIWA, Toshio

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Interelement correction in XRF analysis of iron content in iron ores by glass bead technique von MATSUMOTO, Yoshiro, YAMAJI, Mamoru, FUJINO, Nobukatsu

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Quantitative Electron Probe Microanalysis of Oxygen von Shiraiwa, Toshio, Fujino, Nobukatsu

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