Determination of Pore Size in Mesoporous Thin Films from the Annihilation Lifetime of Positronium von Dull, T. L, Frieze, W. E, Gidley, D. W, Sun, J. N, Yee, A. F

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Interface and Surface Effects on the Glass Transition in Thin Polystyrene Films von DeMaggio, G. B., Frieze, W. E., Gidley, D. W., Zhu, Ming, Hristov, H. A., Yee, A. F.

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Determination of pore-size distribution in low-dielectric thin films von Gidley, D. W., Frieze, W. E., Dull, T. L., Sun, J., Yee, A. F., Nguyen, C. V., Yoon, D. Y.

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Positronium formation as a probe of polymer surfaces and thin films von Xie, L, DeMaggio, GB, Frieze, WE, DeVries, J, Gidley, DW, Hristov, HA, Yee, AF

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How pore size and surface roughness affect diffusion barrier continuity on porous low-k films von SUN, Jia-Ning, YIFAN HU, FRIEZE, William E, WEI CHEN, GIDLEY, David W

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Measurement of the positron surface-state lifetime for Al von LYNN, K. G, FRIEZE, W. E, SCHULTZ, P. J

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Characterizing porosity in nanoporous thin films using positronium annihilation lifetime spectroscopy von Sun, J.N., Hu, Y.F., Frieze, W.E., Gidley, D.W.

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Glancing-angle scattering and neutralization of a positron beam at metal surfaces von GIDLEY, D. W, MAYER, R, FRIEZE, W. E, LYNN, K. G

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Doppler broadening spectroscopy studies of CoSi2 films von WISSMAN, B. D, DULL, T. L, FRIEZE, W. E, GIDLEY, D. W, SKALSEY, M

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Reemitted-positron spectroscopy of thin metal films von GIDLEY, D. W, FRIEZE, W. E

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Positronium annihilation in mesoporous thin films von Gidley, D. W., Frieze, W. E., Dull, T. L., Yee, A. F., Ryan, E. T., Ho, H.-M.

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Positron tunneling microscopy von Frieze, W.E., Gidley, D.W., Wissman, B.D.

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Implementation of a prototype slow positron beam at the NC State University PULSTAR reactor von Hathaway, A.G., Skalsey, M., Frieze, W.E., Vallery, R.S., Gidley, D.W., Hawari, A.I., Xu, J.

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Reemitted-Positron Energy-Loss Spectroscopy: A Novel Probe of Adsorbate Vibrational Levels von Fischer, D. A., Lynn, K. G., Frieze, W. E.

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Reemitted-Positron Spectroscopy of Thin Metal Films von Gidley, D W, Frieze, W E

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Positron Depth-Profiling of Polymer Interfaces von DeMaggio, G.B., Gidley, D.W., Hristov, H.A., Frieze, W.E., Zhu, Ming, Yee, A.F.

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Positron DBS Studies of the Corrosive Breakdown of the Passive Film on Titanium von Dull, T.L., Gidley, D.W., Macdonald, Daniel, Frieze, W.E., Scherer, B.G., Ellerbrock, D.J.

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Depth-profiling plasma-induced densification of porous low- k thin films using positronium annihilation lifetime spectroscopy von Sun, Jia-Ning, Gidley, David W., Hu, Yifan, Frieze, William E., Ryan, E. Todd

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Probing diffusion barrier integrity on porous silica low- k thin films using positron annihilation lifetime spectroscopy von Sun, Jia-Ning, Gidley, David W., Dull, Terry L., Frieze, William E., Yee, Albert F., Ryan, E. Todd, Lin, Simon, Wetzel, Jeff

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Low-energy electron and positron diffraction measurements and analysis on Cu(100) von MAYER, R, CHUN-SI ZHANG, LYNN, K. G, FRIEZE, W. E, JONA, F, MARCUS, P. M

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