Ultra-precise characterization of LCLS hard X-ray focusing mirrors by high resolution slope measuring deflectometry von Siewert, Frank, Buchheim, Jana, Boutet, Sébastien, Williams, Garth J, Montanez, Paul A, Krzywinski, Jacek, Signorato, Riccardo

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BioMAX – the first macromolecular crystallography beamline at MAX IV Laboratory von Ursby, Thomas, Åhnberg, Karl, Appio, Roberto, Aurelius, Oskar, Barczyk, Artur, Bartalesi, Antonio, Bjelčić, Monika, Bolmsten, Fredrik, Cerenius, Yngve, Doak, R. Bruce, Eguiraun, Mikel, Eriksson, Thomas, Friel, Ross J., Gorgisyan, Ishkhan, Gross, Andrea, Haghighat, Vahid, Hennies, Franz, Jagudin, Elmir, Norsk Jensen, Brian, Jeppsson, Tobias, Kloos, Marco, Lidon-Simon, Julio, de Lima, Gustavo M. A., Lizatovic, Robert, Lundin, Magnus, Milan-Otero, Antonio, Milas, Mirko, Nan, Jie, Nardella, Alberto, Rosborg, Anders, Shilova, Anastasya, Shoeman, Robert L., Siewert, Frank, Sondhauss, Peter, Talibov, Vladimir O., Tarawneh, Hamed, Thånell, Johan, Thunnissen, Marjolein, Unge, Johan, Ward, Christopher, Gonzalez, Ana, Mueller, Uwe

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Depth-Dependent Structural Changes in PS‑b‑P2VP Thin Films Induced by Annealing von Wernecke, Jan, Okuda, Hiroshi, Ogawa, Hiroki, Siewert, Frank, Krumrey, Michael

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The Heisenberg-RIXS instrument at the European XFEL von Schlappa, Justine, Ghiringhelli, Giacomo, Van Kuiken, Benjamin E, Teichmann, Martin, Miedema, Piter S, Delitz, Jan Torben, Gerasimova, Natalia, Molodtsov, Serguei, Adriano, Luigi, Baranasic, Bernard, Broers, Carsten, Carley, Robert, Gessler, Patrick, Ghodrati, Nahid, Hickin, David, Hoang, Le Phuong, Izquierdo, Manuel, Mercadier, Laurent, Mercurio, Giuseppe, Parchenko, Sergii, Stupar, Marijan, Yin, Zhong, Martinelli, Leonardo, Merzoni, Giacomo, Peng, Ying Ying, Reuss, Torben, Sreekantan Nair Lalithambika, Sreeju, Techert, Simone, Laarmann, Tim, Huotari, Simo, Schroeter, Christian, Langer, Burkhard, Giessel, Tatjana, Buchheim, Jana, Gwalt, Grzegorz, Sokolov, Andrey, Siewert, Frank, Buechner, Robby, Vaz da Cruz, Vinicius, Eckert, Sebastian, Liu, Chun Yu, Sohrt, Christian, Weniger, Christian, Pietzsch, Annette, Neppl, Stefan, Senf, Friedmar, Scherz, Andreas, Föhlisch, Alexander

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The meV XUV‐RIXS facility at UE112‐PGM1 of BESSY II von Bauer, Karl, Schmidt, Jan-Simon, Eggenstein, Frank, Decker, Régis, Ruotsalainen, Kari, Pietzsch, Annette, Blume, Thomas, Liu, Chun-Yu, Weniger, Christian, Siewert, Frank, Buchheim, Jana, Gwalt, Grzegorz, Senf, Friedmar, Bischoff, Peter, Schwarz, Lisa, Effland, Klaus, Mast, Matthias, Zeschke, Thomas, Rudolph, Ivo, Meißner, Andreas, Föhlisch, Alexander

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Shape- and Element-Sensitive Reconstruction of Periodic Nanostructures with Grazing Incidence X-ray Fluorescence Analysis and Machine Learning von Andrle, Anna, Hönicke, Philipp, Gwalt, Grzegorz, Schneider, Philipp-Immanuel, Kayser, Yves, Siewert, Frank, Soltwisch, Victor

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Development of a high-performance gantry system for a new generation of optical slope measuring profilers von Assoufid, Lahsen, Brown, Nathan, Crews, Dan, Sullivan, Joseph, Erdmann, Mark, Qian, Jun, Jemian, Pete, Yashchuk, Valeriy V., Takacs, Peter Z., Artemiev, Nikolay A., Merthe, Daniel J., McKinney, Wayne R., Siewert, Frank, Zeschke, Thomas

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The Nanometer Optical Component Measuring Machine: a new Sub-nm Topography Measuring Device for X-ray Optics at BESSY von Siewert, Frank, Noll, Tino, Schlegel, Thomas, Zeschke, Thomas, Lammert, Heiner

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Accuracy evaluation for sub-aperture interferometry measurements of a synchrotron mirror using virtual experiments von Wiegmann, Axel, Stavridis, Manuel, Walzel, Monika, Siewert, Frank, Zeschke, Thomas, Schulz, Michael, Elster, Clemens

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The Variable Polarization XUV Beamline P04 at PETRA III: Optics, mechanics and their performance von Viefhaus, Jens, Scholz, Frank, Deinert, Sascha, Glaser, Leif, Ilchen, Markus, Seltmann, Jörn, Walter, Peter, Siewert, Frank

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Characterization and calibration of 2nd generation slope measuring profiler von Siewert, Frank, Buchheim, Jana, Zeschke, Thomas

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Preparation and characterization of B4C coatings for advanced research light sources von Störmer, Michael, Siewert, Frank, Sinn, Harald

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Performance and characterization of the FinEstBeAMS beamline at the MAX IV Laboratory von Chernenko, Kirill, Kivimäki, Antti, Pärna, Rainer, Wang, Weimin, Sankari, Rami, Leandersson, Mats, Tarawneh, Hamed, Pankratov, Vladimir, Kook, Mati, Kukk, Edwin, Reisberg, Liis, Urpelainen, Samuli, Käämbre, Tanel, Siewert, Frank, Gwalt, Grzegorz, Sokolov, Andrey, Lemke, Stephanie, Alimov, Svyatoslav, Knedel, Jeniffa, Kutz, Oliver, Seliger, Tino, Valden, Mika, Hirsimäki, Mika, Kirm, Marco, Huttula, Marko

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Theoretical analysis and optimization of highly efficient multilayer-coated blazed gratings with high fix-focus constant for the tender X-ray region von Huang, Qiushi, Kozhevnikov, Igor V, Sokolov, Andrey, Zhuang, Yeqi, Li, Tongzhou, Feng, Jiangtao, Siewert, Frank, Viefhaus, Jens, Zhang, Zhong, Wang, Zhanshan

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Coatings for FEL optics: preparation and characterization of B4C and Pt von Störmer, Michael, Siewert, Frank, Horstmann, Christian, Buchheim, Jana, Gwalt, Grzegorz

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Simultaneous Dimensional and Analytical Characterization of Ordered Nanostructures von Hönicke, Philipp, Kayser, Yves, Nikolaev, Konstantin V., Soltwisch, Victor, Scheerder, Jeroen E., Fleischmann, Claudia, Siefke, Thomas, Andrle, Anna, Gwalt, Grzegorz, Siewert, Frank, Davis, Jeffrey, Huth, Martin, Veloso, Anabela, Loo, Roger, Skroblin, Dieter, Steinert, Michael, Undisz, Andreas, Rettenmayr, Markus, Beckhoff, Burkhard

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Optimized highly efficient multilayer-coated blazed gratings for the tender X-ray region von Sokolov, Andrey, Huang, Qiushi, Senf, Friedmar, Feng, Jiangtao, Lemke, Stephanie, Alimov, Svyatoslav, Knedel, Jeniffa, Zeschke, Thomas, Kutz, Oliver, Seliger, Tino, Gwalt, Grzegorz, Schäfers, Franz, Siewert, Frank, Kozhevnikov, Igor V, Qi, Runze, Zhang, Zhong, Li, Wenbin, Wang, Zhanshan

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Conception of diffractive wavefront correction for XUV and soft x-ray spectroscopy von Probst, Jürgen, Braig, Christoph, Langlotz, Enrico, Rahneberg, Ilko, Kühnel, Michael, Zeschke, Thomas, Siewert, Frank, Krist, Thomas, Erko, Alexei

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Coatings for FEL optics: preparation and characterization of B 4 C and Pt von Störmer, Michael, Siewert, Frank, Horstmann, Christian, Buchheim, Jana, Gwalt, Grzegorz

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Preparation and characterization of B 4 C coatings for advanced research light sources von Störmer, Michael, Siewert, Frank, Sinn, Harald

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