Understanding Current Instabilities in Conductive Atomic Force Microscopy von Jiang, Lanlan, Weber, Jonas, Puglisi, Francesco Maria, Pavan, Paolo, Larcher, Luca, Frammelsberger, Werner, Benstetter, Guenther, Lanza, Mario

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C-AFM-based thickness determination of thin and ultra-thin SiO 2 films by use of different conductive-coated probe tips von Frammelsberger, Werner, Benstetter, Guenther, Kiely, Janice, Stamp, Richard

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Characterization of the photocurrents generated by the laser of atomic force microscopes von Ji, Yanfeng, Hui, Fei, Shi, Yuanyuan, Iglesias, Vanessa, Lewis, David, Niu, Jiebin, Long, Shibing, Liu, Ming, Hofer, Alexander, Frammelsberger, Werner, Benstetter, Guenther, Scheuermann, Andrew, McIntyre, Paul C., Lanza, Mario

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Dielectric Properties of Ultrathin CaF2 Ionic Crystals von Wen, Chao, Banshchikov, Alexander G., Illarionov, Yury Y., Frammelsberger, Werner, Knobloch, Theresia, Hui, Fei, Sokolov, Nikolai S., Grasser, Tibor, Lanza, Mario

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Current-Limited Conductive Atomic Force Microscopy von Weber, Jonas, Yuan, Yue, Pazos, Sebastian, Kühnel, Fabian, Metzke, Christoph, Schätz, Josef, Frammelsberger, Werner, Benstetter, Günther, Lanza, Mario

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Solid Platinum Nanoprobes for Highly Reliable Conductive Atomic Force Microscopy von Weber, Jonas, Yuan, Yue, Kühnel, Fabian, Metzke, Christoph, Schätz, Josef, Frammelsberger, Werner, Benstetter, Günther, Lanza, Mario

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Nanoscale characterization of CH 3 -terminated Self-Assembled Monolayer on copper by advanced scanning probe microscopy techniques von Berthold, Tobias, Benstetter, Guenther, Frammelsberger, Werner, Rodríguez, Rosana, Nafría, Montserrat

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C-AFM-based thickness determination of thin and ultra-thin SiO2 films by use of different conductive-coated probe tips von FRAMMELSBERGER, Werner, BENSTETTER, Guenther, KIELY, Janice, STAMP, Richard

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Dielectric Properties of Ultrathin CaF 2 Ionic Crystals von Wen, Chao, Banshchikov, Alexander G, Illarionov, Yury Y, Frammelsberger, Werner, Knobloch, Theresia, Hui, Fei, Sokolov, Nikolai S, Grasser, Tibor, Lanza, Mario

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Dielectric Properties of Ultrathin CaF2 Ionic Crystals von Wen, Chao, Banshchikov, Alexander G., Illarionov, Yury Y., Frammelsberger, Werner, Knobloch, Theresia, Hui, Fei, Sokolov, Nikolai S., Grasser, Tibor, Lanza, Mario

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Nanoscale characterization of copper oxide films by Kelvin Probe Force Microscopy von Berthold, Tobias, Benstetter, Guenther, Frammelsberger, Werner, Rodríguez, Rosana, Nafría, Montserrat

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Dielectric Properties of Ultrathin CaF 2 Ionic Crystals von Wen, Chao, Banshchikov, Alexander G, Illarionov, Yury Y, Frammelsberger, Werner, Knobloch, Theresia, Hui, Fei, Sokolov, Nikolai S, Grasser, Tibor, Lanza, Mario

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On the Limits of Scanning Thermal Microscopy of Ultrathin Films von Metzke, Christoph, Frammelsberger, Werner, Weber, Jonas, Kühnel, Fabian, Zhu, Kaichen, Lanza, Mario, Benstetter, And Günther

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Nanoscale characterization of CH3-terminated Self-Assembled Monolayer on copper by advanced scanning probe microscopy techniques von Berthold, Tobias, Benstetter, Guenther, Frammelsberger, Werner, Rodríguez, Rosana, Nafría, Montserrat

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Protective nanometer films for reliable Cu-Cu connections von Berthold, Tobias, Benstetter, Guenther, Frammelsberger, Werner, Bogner, Manuel, Rodríguez, Rosana, Nafría, Montserrat

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Numerical Study of Hydrodynamic Forces for AFM Operations in Liquid von Rodríguez, Rosana, Frammelsberger, Werner, Benstetter, Guenther, Berthold, Tobias, Nafría, Montserrat

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Thickness determination of thin and ultra-thin SiO 2 films by C-AFM IV-spectroscopy von Frammelsberger, Werner, Benstetter, Guenther, Kiely, Janice, Stamp, Richard

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Thickness determination of thin and ultra-thin SiO2 films by C-AFM IV-spectroscopy von FRAMMELSBERGER, Werner, BENSTETTER, Guenther, KIELY, Janice, STAMP, Richard

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The effect of the surface layer of tetrahedral amorphous carbon films on their tribological and electron emission properties investigated by atomic force microscopy von Liu, Dongping, Benstetter, Günther, Frammelsberger, Werner

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Nanoscale electron field emissions from the bare, hydrogenated,and graphitelike-layer-covered tetrahedral amorphouscarbon films von Liu, Dongping, Benstetter, Günther, Frammelsberger, Werner

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