Leakage current modeling of test structures for characterization of dark current in CMOS image sensors von Loukianova, N.V., Folkerts, H.O., Maas, J.P.V., Verbugt, D.W.E., Mierop, A.J., Hoekstra, W., Roks, E., Theuwissen, A.J.P.

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A 35-mm format 11 M pixel full-frame CCD for professional digital still imaging von Bosiers, J.T., Dillen, B.G.M., Draijer, C., Kleimann, A.C., Polderdijk, F.J., de Wolf, M.A.R.C., Klaassens, W., Theuwissen, A.J.P., Peek, H.L., Folkerts, H.O.

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Semiconductor device with an image sensor and method for the manufacture of such a device von HERMES DANIEL HENDRIK JAN MARIA, HOEKSTRA WILLEM, TOREN WILLEM-JAN, FOLKERTS HEIN OTTO, MAAS JORIS PIETER VALENTIJN, MAES WILLEM HENDRIK, VERBUGT DANIEL WILHELMUS ELISABETH

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Versatile building-block architecture for large area, high performance CCD imagers von Theuwissen, A.

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Semiconductor Device With An Image Sensor And Method For The Manufacture Of Such A Device von HERMES DANIEL HENDRIK JAN MARIA, HOEKSTRA WILLEM, TOREN WILLEM-JAN, FOLKERTS HEIN OTTO, MAAS JORIS PIETER VALENTIJN, MAES WILLEM HENDRIK, VERBUGT DANIEL WILHELMUS ELISABETH

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Opto-electronic semiconductor device, method of manufacturing same, and camera provided with such a device von FOLKERTS, HEIN OTTO, MAAS, JORIS PIETER VALENTIJN, VERBUGT, DANIEL WILHELMUS ELISABETH, HOEKSTRA, WILLEM, TOREN, WILLEM JAN

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Image sensor, camera system comprising the image sensor and method of manufacturing such a device von LOUKIANOVA, NATALIA V, FOLKERTS, HEIN OTTO, MAAS, JORIS PIETER VALENTIJN, HERMES, DANIEL HENDRIK JAN MARIA, WILLEM HOEKSTRA, ADRIANUS JOHANNES MIEROP, VERBUGT, DANIEL WILHELMUS ELISABETH

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