Elizabeth Cady Stanton. Naissance du féminisme américain à Seneca Falls von Claudette Fillard (dir.)

Volltext

Near field optical behaviour of C supertips von Castagné, M., Benfedda, M., Lahimer, S., Falgayrettes, P., Fillard, J.P.

Volltext

Optical properties of silicon-nitride atomic-force-microscopy tips in scanning tunneling optical microscopy: experimental study von Castagne, M, Prioleau, C, Fillard, J P

Volltext

A new approach to the similarity relations in the fuzzy set theory von Faurous, P., Fillard, J.P.

Volltext

Atomic force microscopy silicon tips as photon tunneling sensors: a resonant evanescent coupling experiment von Fillard, J P, Castagne, M, Prioleau, C

Volltext

A study of semiconductor surfaces and devices by coupled IR photon tunneling and atomic-force microscopy von Gall-Borrut, P., Castagne, M., Weyher, J.L., Fillard, J.P., Bonnafe, J.

Volltext

Investigations of oxygen precipitates in Czochralski silicon wafers by using infrared tomography von Fillard, J.P.

Volltext

Qualification by optical means of CdTe substrates von Triboulet, R., Durand, A., Gall, P., Bonnafé, J., Fillard, J.P., Krawczyk, S.K.

Volltext

Microtomography observation of precipitates in semi-insulating GaAs materials von GALL, P, FILLARD, J. P, CASTAGNE, M, WEYHER, J. L, BONNAFE, J

Volltext

Optical and electrical properties of SnO2 thin films in relation to their stoichiometric deviation and their crystalline structure von Manifacier, J.C., De Murcia, M., Fillard, J.P., Vicario, E.

Volltext

Virtual photon scattering at subwavelength sized tips von FILLARD, J. P, CASTAGNE, M, BENFEDDA, M, LAHIMER, S, DANZEBRINK, H. U

Volltext

High resolution and sensitivity infrared tomography von Fillard, J.P., Montgomery, P.C., Gall, P., Castagné, M., Bonnafé, J.

Volltext

Analysis of transient phenomena in GaAs within the metastable model von Santic, B., Radic, N., Desnica, U. V., Fillard, J. P.

Volltext

Near infrared dark-field microscopy with video for studying defects in III-V compound materials von Montgomery, P C, Fillard, J P

Volltext

Non-destructive optical inspection of evaporated fluoride glass layers von Montgomery, P.C., Montaner, D., Jacoboni, C., Boulard, B., Fillard, J.P.

Volltext

Phase-stepping microscopy (PSM): a qualification tool for electronic and optoelectronic devices von Montgomery, P C, Fillard, J P, Castagne, M, Montaner, D

Volltext

Laser-scanning tomography: a survey of recent investigations in semiconductor materials von Fillard, J P, Gall, P, Bonnafe, J, Castagne, M, Ogawa, T

Volltext

Recognition and mapping of microdefects by photoetching, laser-scattering tomography and photoluminescence in SI undoped GaAs after different ingot-annealing treatments von Weyher, J L, Gall, P, Dang, Le Si, Fillard, J P, Bonnafe, J, Rufer, H, Baumgartner, M, Lohnert, K

Volltext

LST-detected microprecipitates and their role in the performance of GaAs integrated circuits von Castagne, M, Fillard, J P, Achvar, D, Gall, P

Volltext

Deposition of In2O3SnO2 layers on glass substrates using a spraying method von Manifacier, J.C, Fillard, J.P, Bind, J.M

Volltext