X-ray diffraction from low-dimensional structures von Fewster, P F

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A high-resolution multiple-crystal multiple-reflection diffractometer von Fewster, P. F.

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Combining high-resolution X-ray diffractometry and topography von Fewster, P. F.

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Reciprocal space mapping von Fewster, Paul F.

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Absolute lattice parameter measurement von Fewster, P F

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The simulation and interpretation of diffraction profiles from partially relaxed layer structures von Fewster, P. F.

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High-mobility thin InSb films grown by molecular beam epitaxy von Zhang, T., Clowes, S. K., Debnath, M., Bennett, A., Roberts, C., Harris, J. J., Stradling, R. A., Cohen, L. F., Lyford, T., Fewster, P. F.

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Absolute Lattice-Parameter Measurement von Fewster, P. F., Andrew, N. L.

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High-resolution diffraction-space mapping and topography von Fewster, P. F.

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Dynamical diffraction in layered systems - a quest for the final formula von Holý, V, Fewster, P F

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Interface roughness and period variations in MQW structures determined by X-ray diffraction von Fewster, P. F.

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Composition determination in quantum dots with in-plane scattering compared with STEM and EDX analysis von Fewster, P F, Holý, V, Zhi, D

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Characterization of quantum wells by X-ray diffraction von Fewster, P F

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Evidence for dislocation-related amphoteric behaviour of Si dopant in high-mobility InSb thin films von Zhang, T, Harris, J J, Clowes, S K, Debnath, M, Bennett, A, Cohen, L F, Lyford, T, Fewster, P F

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SiGe quantum cascade structures for light emitting devices von Zhang, J., Li, X.B., Neave, J.H., Norris, D.J., Cullis, A.G., Kelsall, R.W., Lynch, S., Towsend, P., Paul, D.J., Fewster, P.F.

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GSMBE growth and structural characterisation of SiGeC layers for HBT von Zhang, J., Neave, J.H., Li, X.B., Fewster, P.F., El Mubarek, H.A.W., Ashburn, P., Mitrovic, I.Z., Buiu, O., Hall, S.

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Interpretation of the diffraction profile resulting from strain relaxation in epilayers von Kidd, P, Fewster, P F, Andrew, N L

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Composition and lattice-mismatch measurement of thin semiconductor layers by x-ray diffraction von FEWSTER, P. F, CURLING, C. J

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The need to accommodate monitor height changes between sitting and standing von Fewster, Kayla M., Riddell, Maureen F., Kadam, Surabhi, Callaghan, Jack P.

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Determination of the Mn concentration in GaMnAs von Zhao, L X, Campion, R P, Fewster, P F, Martin, R W, Ber, B Ya, Kovarsky, A P, Staddon, C R, Wang, K Y, Edmonds, K W, Foxon, C T, Gallagher, B L

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