Method for optimizing a set of scan diagnostic patterns von DISTLER FRANK O, BRUNKHORST VANESSA, FARNSWORTH, III L. OWEN, HUMPHREY ALAN R, STANLEY KEVIN W

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Method for optimizing a set of scan diagnostic patterns von Brunkhorst, Vanessa, Distler, Frank O, Farnsworth, III, L. Owen, Humphrey, Alan R, Stanley, Kevin W

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Internal cache for on chip test data storage von Bartenstein, Thomas W, Farnsworth, III, L. Owen, Heaberlin, Douglas C, Horton, III, Edward E, Huisman, Leendert M, Pastel, Leah M, Richard, Glen E, Rosner, Raymond J, Woytowich, Francis

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Internal cache for on chip test data storage von RICHARD GLEN E, BARTENSTEIN THOMAS W, HUISMAN LEENDERT M, FARNSWORTH, III L. OWEN, HEABERLIN DOUGLAS C, PASTEL LEAH M, WOYTOWICH FRANCIS, HORTON, III EDWARD E, ROSNER RAYMOND J

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Method of electrically blowing fuses under control of an on-chip tester interface apparatus von Anand, Darren L, Cowan, Bruce, Farnsworth, III, L. Owen, Gillis, Pamela S, Jakobsen, Peter O, Mondal, Krishnendu, Oakland, Steven F, Ouellette, Michael R, Wheater, Donald L

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Method of electrically blowing fuses under control of an on-chip tester interface apparatus von ANAND DARREN L, GILLIS PAMELA S, WHEATER DONALD L, FARNSWORTH, III L. OWEN, JAKOBSEN PETER O, OUELLETTE MICHAEL R, OAKLAND STEVEN F, COWAN BRUCE, MONDAL KRISHNENDU

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