Wafer-Scale, Sub-5 nm Junction Formation by Monolayer Doping and Conventional Spike Annealing von Ho, Johnny C, Yerushalmi, Roie, Smith, Gregory, Majhi, Prashant, Bennett, Joseph, Halim, Jeffri, Faifer, Vladimir N, Javey, Ali

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Determination of the minority carrier diffusion length in compositionally graded Cu(In,Ga)Se2 solar cells using electron beam induced current von Brown, Gregory, Faifer, Vladimir, Pudov, Alex, Anikeev, Sergey, Bykov, Eugene, Contreras, Miguel, Wu, Junqiao

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Determination of the minority carrier diffusion length in compositionally graded Cu ( In , Ga ) Se 2 solar cells using electron beam induced current von Brown, Gregory, Faifer, Vladimir, Pudov, Alex, Anikeev, Sergey, Bykov, Eugene, Contreras, Miguel, Wu, Junqiao

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Theory of electroluminescence intensity and insights into recombination in thin film solar cells von Brown, Gregory, Faifer, Vladimir, Cardozo, Ben, Bykov, Eugene, Contreras, Miguel

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Quantitative Imaging of Electronic Nonuniformities in Cu(In,Ga)Se-2 Solar Cells von Brown, G., Pudov, A., Cardozo, B., Faifer, V., Bykov, E., Contreras, M.

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Theory of electroluminescence intensity and insights into recombinationin thin film solar cells von Brown, Gregory, Faifer, Vladimir, Cardozo, Ben, Bykov, Eugene, Contreras, Miguel

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Quantitative imaging of electronic nonuniformitiesin Cu ( In , Ga ) Se 2 solar cells von Brown, Gregory, Pudov, Alex, Cardozo, Ben, Faifer, Vladimir, Bykov, Eugene, Contreras, Miguel

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Quantitative imaging of electronic nonuniformities in Cu(In,Ga)Se2 solar cells von Brown, Gregory, Pudov, Alex, Cardozo, Ben, Faifer, Vladimir, Bykov, Eugene, Contreras, Miguel

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High-Resolution Mapping of Low-Dose Implants von Halim, Jeffri, Mineji, Akira, Faifer, Vladimir, Current, Michael

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Quantitative measurements of electronic nonuniformities in thin film photovoltaics and their impact on device performance von Brown, G., Faifer, V., Pudov, A., Cardozo, B., Jackrel, D.

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High-Resolution Junction Photo-Voltage Mapping of Sheet Resistance and Leakage Current Variations with ms-Timescale Annealing Methods von Faifer, Vladimir, Current, Michael I., Ohno, Naotsugu, Halim, Jeffri, Lu, Jason

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Method and apparatus for non-contact measurement of internal quantum efficiency in light emitting diode structures von Faifer Vladimir N

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Junction Photovoltage (JPV) Techniques for Ultra-Shallow Junction Characterization von Faifer, Vladimir N., Current, Michael I., Schroder, D., Clarysse, Trudo, Vandervorst, Wilfried

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METHOD AND APPARATUS FOR NON-CONTACT MEASUREMENT OF INTERNAL QUANTUM EFFICIENCY IN LIGHT EMITTING DIODE STRUCTURES von FAIFER, VLADIMIR N

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Systems and methods for measuring electrical characteristics of a material using a non-destructive multi-point probe von Semonin, Octavi Santiago Escala, Faifer, Vladimir N, Kayes, Brendan M, Rodriguez, Edwin J, Limpinsel, Jan Moritz

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METHOD AND APPARATUS FOR NON-CONTACT MEASUREMENT OF INTERNAL QUANTUM EFFICIENCY IN LIGHT EMITTING DIODE STRUCTURES von FAIFER, VLADIMIR N

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Method and Apparatus for Non-Contact Measurement of Internal Quantum Efficiency in Light Emitting Diode Structures von FAIFER VLADIMIR N

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SYSTEMS AND METHODS FOR MEASURING ELECTRICAL CHARACTERISTICS OF A MATERIAL USING A NON-DESTRUCTIVE MULTI-POINT PROBE von FAIFER, Vladimir N, KAYES, Brendan M, LIMPINSEL, Jan Moritz, SEMONIN, Octavi Santiago Escala, RODRIGUEZ, Edwin J

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SYSTEMS AND METHODS FOR MEASURING ELECTRICAL CHARACTERISTICS OF A MATERIAL USING A NON-DESTRUCTIVE MULTI-POINT PROBE von Semonin, Octavi Santiago Escala, Faifer, Vladimir N, Kayes, Brendan M, Rodriguez, Edwin J, Limpinsel, Jan Moritz

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SYSTEMS AND METHODS FOR MEASURING ELECTRICAL CHARACTERISTICS OF A MATERIAL USING A NON-DESTRUCTIVE MULTI-POINT PROBE von FAIFER, Vladimir N, KAYES, Brendan M, LIMPINSEL, Jan Moritz, SEMONIN, Octavi Santiago Escala, RODRIGUEZ, Edwin J

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