A Study on the Reliability of Thermoelectric Couple Networks von Matthes, Christopher S. R., Everline, Chester J., Woerner, David F., Hendricks, Terry J.

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Bayesian Approach to Quantifying Epistemic Uncertainty in a Processor Availability model von Everline, Chester J

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Comparison of techniques for modeling accident progression in dynamic aerospace applications with and without repair von Everline, Chester J., Paulos, Todd

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Systems and methods for circuit lifetime evaluation von Heaps, Timothy L., Sheldon, Douglas J., Bowerman, Paul N., Everline, Chester J., Shalom, Eddy, Rasmussen, Robert D.

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Systems and methods for circuit lifetime evaluation von SHELDON DOUGLAS J, BOWERMAN PAUL N, HEAPS TIMOTHY L, SHALOM EDDY, EVERLINE CHESTER J, RASMUSSEN ROBERT D

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SYSTEMS AND METHODS FOR CIRCUIT LIFETIME EVALUATION von SHELDON DOUGLAS J, BOWERMAN PAUL N, HEAPS TIMOTHY L, SHALOM EDDY, EVERLINE CHESTER J, RASMUSSEN ROBERT D

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License-plate holder von EVERLINE CHESTER J

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Europa Clipper planetary protection probabilistic risk assessment summary von McCoy, Kelli J., DiNicola, Michael, Everline, Chester, Burgoyne, Hayden, Reinholtz, Kirk, Clement, Brian

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