Advances in Large-Scale Metrology – Review and future trends von Schmitt, R.H., Peterek, M., Morse, E., Knapp, W., Galetto, M., Härtig, F., Goch, G., Hughes, B., Forbes, A., Estler, W.T.

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ASME B89.4.19 Performance Evaluation Tests and Geometric Misalignments in Laser Trackers von Muralikrishnan, B, Sawyer, D, Blackburn, C, Phillips, S, Borchardt, B, Estler, W T

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Dimensional artefacts to achieve metrological traceability in advanced manufacturing von Carmignato, S., De Chiffre, L., Bosse, H., Leach, R.K., Balsamo, A., Estler, W.T.

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Measurement technologies for precision positioning von Gao, W., Kim, S.W., Bosse, H., Haitjema, H., Chen, Y.L., Lu, X.D., Knapp, W., Weckenmann, A., Estler, W.T., Kunzmann, H.

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Displacement Uncertainty in Interferometric Radius Measurements von Schmitz, T.L., Evans, C.J., Davies, A., Estler, W.T.

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Uncertainty Analysis for Angle Calibrations Using Circle Closure von Estler, W Tyler

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Contribution of CIRP to the Development of Metrology and Surface Quality Evaluation during the last fifty years von Peters, J., Bryan, J.B., Estler, W.T., Evans, C., Kunzmann, H., Lucca, D.A., Sartori, S., Sato, H., Thwaite, E.G., Vanherck, P., Hocken, R.J., Peklenik, J., Pfeifer, T., Trumpold, H., Vorburger, T.V.

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Large-Scale Metrology – An Update von Estler, W.T., Edmundson, K.L., Peggs, G.N., Parker, D.H.

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Uncertainty Due to Finite Resolution Measurements von Phillips, S D, Toman, B, Estler, W T

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The estimation of measurement uncertainty of small circular features measured by coordinate measuring machines von Phillips, S.D, Borchardt, B, Estler, W.T, Buttress, John

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Angle Metrology of Dispersion Prisms von Estler, W.T., Queen, Y.H.

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A Careful Consideration of the Calibration Concept von Phillips, S D, Estler, W T, Doiron, T, Eberhardt, K R, Levenson, M S

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A Distribution-Independent Bound on the Level of Confidence in the Result of a Measurement von Estler, W Tyler

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An Advanced Angle Metrology System von Estler, W.T., Queen, Y.H., Bryan, J.

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Calculation of Measurement Uncertainty Using Prior Information von Phillips, S D, Estler, W T, Levenson, M S, Eberhardt, K R

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XUV optics characterization at the National Institute of Standards and Technology von Watts, R.N., Tarrio, C., Lucatorto, T.B., Madden, R.P., Deslattes, R.D., Caticha, A., Estler, W.T., Evans, C.J., McWaid, T., Fu, J., Vorburger, T.V.

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