ASME B89.4.19 Performance Evaluation Tests and Geometric Misalignments in Laser Trackers von Muralikrishnan, B, Sawyer, D, Blackburn, C, Phillips, S, Borchardt, B, Estler, W T

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Large-Scale Metrology – An Update von Estler, W.T., Edmundson, K.L., Peggs, G.N., Parker, D.H.

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Dimensional artefacts to achieve metrological traceability in advanced manufacturing von Carmignato, S., De Chiffre, L., Bosse, H., Leach, R.K., Balsamo, A., Estler, W.T.

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A Careful Consideration of the Calibration Concept von Phillips, S D, Estler, W T, Doiron, T, Eberhardt, K R, Levenson, M S

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Measurement technologies for precision positioning von Gao, W., Kim, S.W., Bosse, H., Haitjema, H., Chen, Y.L., Lu, X.D., Knapp, W., Weckenmann, A., Estler, W.T., Kunzmann, H.

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The estimation of measurement uncertainty of small circular features measured by coordinate measuring machines von Phillips, S.D, Borchardt, B, Estler, W.T, Buttress, John

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Advances in Large-Scale Metrology – Review and future trends von Schmitt, R.H., Peterek, M., Morse, E., Knapp, W., Galetto, M., Härtig, F., Goch, G., Hughes, B., Forbes, A., Estler, W.T.

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Error compensation for CMM touch trigger probes von Estler, W.Tyler, Phillips, S.D., Borchardt, B., Hopp, T., Witzgall, C., Levenson, M., Eberhardt, K., McClain, M., Shen, Y., Zhang, X.

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Uncertainty Due to Finite Resolution Measurements von Phillips, S D, Toman, B, Estler, W T

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High-accuracy displacement interferometry in air von Estler, W T

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Displacement Uncertainty in Interferometric Radius Measurements von Schmitz, T.L., Evans, C.J., Davies, A., Estler, W.T.

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Calculation of Measurement Uncertainty Using Prior Information von Phillips, S D, Estler, W T, Levenson, M S, Eberhardt, K R

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Uncertainty Analysis for Angle Calibrations Using Circle Closure von Estler, W Tyler

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Contribution of CIRP to the Development of Metrology and Surface Quality Evaluation during the last fifty years von Peters, J., Bryan, J.B., Estler, W.T., Evans, C., Kunzmann, H., Lucca, D.A., Sartori, S., Sato, H., Thwaite, E.G., Vanherck, P., Hocken, R.J., Peklenik, J., Pfeifer, T., Trumpold, H., Vorburger, T.V.

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Self-Calibration: Reversal, Redundancy, Error Separation, and ‘Absolute Testing’ von Evans, Chris J., Hocken, Robert J., Estler, W. Tyler

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Uncertainty estimation for multiposition form error metrology von Tyler Estler, W., Evans, Chris J., Shao, L.Z.

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An Advanced Angle Metrology System von Estler, W.T., Queen, Y.H., Bryan, J.

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Practical aspects of touch-trigger probe error compensation von Estler, W.Tyler, Phillips, S.D., Borchardt, B., Hopp, T., Levenson, M., Eberhardt, K., McClain, M., Shen, Y., Zhang, X.

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Angle Metrology of Dispersion Prisms von Estler, W.T., Queen, Y.H.

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XUV optics characterization at the National Institute of Standards and Technology von Watts, R.N., Tarrio, C., Lucatorto, T.B., Madden, R.P., Deslattes, R.D., Caticha, A., Estler, W.T., Evans, C.J., McWaid, T., Fu, J., Vorburger, T.V.

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