Impact of the Frequency Dependence of the Parasitic Admittance on the Diffusion Noise of a Diode Junction at Low Bias von Graffeuil, J., Escotte, L., Tartarin, J. G.

Volltext

Low-frequency noise in reverse-biased Schottky barriers on InAlN/AlN/GaN heterostructures von Nsele, S. D., Escotte, L., Tartarin, J.-G., Piotrowicz, S., Delage, S. L.

Volltext

A study of the correlation between high-frequency noise and phase noise in low-noise silicon-based transistors von Cibiel, G., Escotte, L., Llopis, O.

Volltext

SiGe HBT-Based Active Cold Load for Radiometer Calibration von Leynia de la Jarrige, E., Escotte, L., Goutoule, J.M., Gonneau, E., Rayssac, J.

Volltext

C-Band Noise-Parameter Measurement of Microwave Amplifiers Under Nonlinear Conditions von Chambon, C., Escotte, L., Gribaldo, S., Llopis, O.

Volltext

Noise behavior of microwave amplifiers operating under nonlinear conditions von Escotte, L., Gonneau, E., Chambon, C., Graffeuil, J.

Volltext

Broadband Frequency Dispersion Small-Signal Modeling of the Output Conductance and Transconductance in AlInN/GaN HEMTs von Nsele, S. D., Escotte, L., Tartarin, J., Piotrowicz, S., Delage, S. L.

Volltext

Low-Frequency Noise Sources and Gain Stability in Microwave Amplifiers for Radiometry von Gonneau, E., Escotte, L.

Volltext

Comments on "Microwave noise modeling for InP-InGaAs HBTs" von Escotte, L., Graffeuil, J.

Volltext

Identification of the physical signatures of CDM induced latent defects into a DC–DC converter using low frequency noise measurements von Gao, Y., Guitard, N., Salamero, C., Bafleur, M., Bary, L., Escotte, L., Gueulle, P., Lescouzeres, L.

Volltext

Long-term reliability of silicon bipolar transistors subjected to low constraints von Crosson, A., Escotte, L., Bafleur, M., Talbourdet, D., Crétinon, L., Perdu, P., Perez, G.

Volltext

Evaluation of noise parameter extraction methods von Escotte, L., Plana, R., Graffeuil, J.

Volltext

Recent evolutions in low phase noise microwave sources and related problems of noise modeling von Llopis, O, Gribaldo, S, Chambon, C, Onillon, B, Tartarin, J G, Escotte, L

Volltext

Noise modeling of microwave heterojunction bipolar transistors von Escotte, L., Roux, J.-P., Plana, R., Graffeuil, J., Gruhle, A.

Volltext

On-wafer noise characterization of low-noise amplifiers in the Ka-band von Long, S., Escotte, L., Graffeuil, J., Brasseau, F., Cazaux, J.L.

Volltext

Low-frequency noise properties of SiGe HBT's and application to ultra-low phase-noise oscillators von Van Haaren, B., Regis, M., Llopis, O., Escotte, L., Gruhle, A., Mahner, C., Plana, R., Graffeuil, J.

Volltext

Noise behavior in SiGe devices von Régis, M., Borgarino, M., Bary, L., Llopis, O., Graffeuil, J., Escotte, L., Koenig, U., Plana, R.

Volltext

Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications von GUITARD, N, TREMOUILLES, D, BAFLEUR, M, ESCOTTE, L, BARY, L, PERDU, P, SARRABAYROUSE, G, NOLHIER, N, REYNA-ROJAS, R

Volltext

Microwave noise parameters of pseudomorphic GaInAs HEMTs under optical illumination von Escotte, L., Grenier, K., Tartarin, J.G., Graffeuil, J.

Volltext

A GaAlAs-GaAs integrated coherence modulator von Khalfallah, S., Dubreuil, P., Escotte, L., Legros, R., Fontaine, C., Munoz-Yague, A., Beche, B., Porte, H.

Volltext