Treffer 1 - 5 von 5 für Suche 'Eonjo Byun', Suchdauer: 0,47s Treffer weiter einschränken
  1. 1
    At-speed Test of High-Speed DUT Using Built-Off Test Interface

    At-speed Test of High-Speed DUT Using Built-Off Test Interface von Joonsung Park, Jae Wook Lee, Jaeyong Chung, Kihyuk Han, Abraham, J A, Eonjo Byun, Cheol-Jong Woo, Sejang Oh


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  2. 2
    Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate

    Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate von Jaeyong Chung, Joonsung Park, Abraham, Jacob A, Eonjo Byun, Cheol-Jong Woo


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  3. 3
    Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip

    Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip von Han, Kihyuk, Park, Joonsung, Lee, Jae Wook, Chung, Jaeyong, Byun, Eonjo, Woo, Cheol-Jong, Oh, Sejang, Abraham, Jacob A.

    Veröffentlicht in Journal of electronic testing

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  4. 4
    A Built-In Self-Test scheme for high speed I/O using cycle-by-cycle edge control

    A Built-In Self-Test scheme for high speed I/O using cycle-by-cycle edge control von Hyunjin Kim, Jaeyong Chung, Abraham, Jacob A, Eonjo Byun, Cheol-Jong Woo


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  5. 5
    Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip

    Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip von Kihyuk Han, Joonsung Park, Jae Wook Lee, Abraham, J.A., Eonjo Byun, Cheol-Jong Woo, Sejang Oh


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