Response of advanced bipolar processes to ionizing radiation von Enlow, E.W., Pease, R.L., Combs, W., Schrimpf, R.D., Nowlin, R.N.

Volltext

The relationship of holding points and a general solution for CMOS latchup von Sleeter, D.J., Enlow, E.W.

Volltext

Photocurrent modeling of modern microcircuit pn junctions von Enlow, E.W., Alexander, D.R.

Volltext

Total dose induced hole trapping in trench oxides von Enlow, E.W., Pease, R.L., Combs, W.E., Platteter, D.G.

Volltext

Test Structure to Microcircuit Correlation von Enlow, Edward W

Volltext bestellen

Statistical Variations in Failure Thresholds of Silicon Npn Transistors Subjected to Electrical Overstress von Alexander, David R., Enlow, Edward W., Karaskiewicz, Ronald J.

Volltext

Subthreshold Technique for Fixed and Interface Trapped Charge Separation in Irradiated MOSFETs von Enlow, Edward W, Pease, Ronald L, Alexander, David R

Volltext bestellen