Response of advanced bipolar processes to ionizing radiation von Enlow, E.W., Pease, R.L., Combs, W., Schrimpf, R.D., Nowlin, R.N.

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Trends in the total-dose response of modern bipolar transistors von Nowlin, R.N., Enlow, E.W., Schrimpf, R.D., Combs, W.E.

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The relationship of holding points and a general solution for CMOS latchup von Sleeter, D.J., Enlow, E.W.

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Photocurrent modeling of modern microcircuit pn junctions von Enlow, E.W., Alexander, D.R.

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Wafer-level radiation testing for hardness assurance von Shaneyfelt, M.R., Hughes, K.L., Schwank, J.R., Sexton, F.W., Fleetwood, D.M., Winokur, P.S., Enlow, E.W.

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Accuracy of the charge pumping technique for small geometry MOSFETs von Gaitan, M., Enlow, E.W., Russell, T.J.

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Total dose induced hole trapping in trench oxides von Enlow, E.W., Pease, R.L., Combs, W.E., Platteter, D.G.

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Semiconductor Failure Threshold Estimation Problem in Electromagnetic Assessment von Enlow, E. W., Wunsch, D. C.

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Mechanisms of ionizing-radiation-induced degradation in modern bipolar devices von Nowlin, R.N., Schrimpf, R.D., Enlow, E.W., Combs, W.E., Pease, R.L.

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