Effect of Hydrogen on Defects of AlGaN/GaN HEMTs Characterized by Low-Frequency Noise von Chen, Y. Q., Zhang, Y. C., Liu, Y., Liao, X. Y., En, Y. F., Fang, W. X., Huang, Y.

Volltext

Hydrogen-dependent low frequency noise and its physical mechanism of HfO2 resistance change random access memory von Chen, Y. Q., Liu, X., Liu, Y., Peng, C., Fang, W. X., En, Y. F., Huang, Y.

Volltext

Effect of Hot Electron Stress on AlGaN/GaN HEMTs of Hydrogen Poisoning von He, J., Chen, Y. Q., He, Z. Y., En, Y. F., Liu, C., Huang, Y., Li, Z., Tang, M. H.

Volltext

Analysis of Trap and Recovery Characteristics Based on Low-Frequency Noise for E-Mode GaN HEMTs Under Electrostatic Discharge Stress von Xu, X. B., Li, B., Chen, Y. Q., Wu, Z. H., He, Z. Y., Liu, L., He, S. Z., En, Y. F., Huang, Y.

Volltext

Trap Analysis Based on Low-Frequency Noise for SiC Power MOSFETs Under Repetitive Short-Circuit Stress von Wang, J. L., Chen, Y. Q., Feng, J. T., Xu, X. B., En, Y. F., Hou, B., Gao, R., Chen, Y., Huang, Y., Geng, K. W.

Volltext

Investigation of electrical properties of individual GaN nanowire-based ferroelectric field effect transistor von Chen, Y. Q., Xu, X. B., Lu, Y. D., Wang, X., En, Y. F.

Volltext

Effect of Atmosphere on Electrical Characteristics of AlGaN/GaN HEMTs Under Hot-Electron Stress von Liu, C., Chen, Y. Q., Liu, Y., Lai, P., He, Z. Y., En, Y. F., Wang, T. Y., Huang, Y.

Volltext

Analysis of trap and recovery characteristics based on low-frequency noise for E-mode GaN HEMTs with p-GaN gate under repetitive short-circuit stress von Xu, X. B., Li, B., Chen, Y. Q., Wu, Z. H., He, Z. Y., En, Y. F., Huang, Y.

Volltext

Investigations on electrical parameters degradation and recovery of E-mode GaN high-electron mobility transistors under repetitive unclamped inductive switching stresses based on l... von Xu, X B, Li, B, Chen, Y Q, Wu, Z H, He, Z Y, En, Y F, Huang, Y

Volltext

Degradation mechanism of AlGaN/GaN HEMTs during high temperature operation stress von Chen, Y Q, Liao, X Y, Zeng, C, Peng, C, Liu, Y, Li, R G, En, Y F, Huang, Y

Volltext

Degradation Behavior and Mechanism of SiC Power MOSFETs Under Repetitive Transmission Line Pulse Stress von Xu, X. B., Chen, Y. Q., Chen, Y., Fan, Z. H., Wei, Q. R., Wang, J. L., He, Z. Y., Liu, C., Lu, G. G., Huang, Y., Ren, Y., En, Y. F.

Volltext

Effects of Stress and Depolarization on Electrical Behaviors of Ferroelectric Field-Effect Transistor von Chen, Y. Q., En, Y. F., Huang, Y., Kong, X. D., Fang, W. X., Zheng, X. J.

Volltext

Effect of temperature on the electrical properties of a metal-ferroelectric (SrBi2Ta2O9)-insulator (HfTaO)-silicon capacitor von Chen, Y Q, Xu, X B, Lei, Z F, Liao, X Y, Wang, X, Zeng, C, En, Y F, Huang, Y

Volltext

Effect of Hydrogen on Electrical Properties of Metal-Ferroelectric (SrBi2Ta2O9)-Insulator (HfTaO)-Silicon Capacitor von Chen, Y. Q., Xu, X. B., Lei, Z. F., Zeng, C., Liao, X. Y., En, Y. F., Huang, Y., Fang, W. X.

Volltext

An ion beam layer removal method of determining the residual stress in the as-fabricated TSV-Cu/TiW/SiO2/Si interface on a nanoscale von Chen, S., En, Y.F., Li, G.Y., Wang, Z.Z., Gao, R., Ma, Rui, Zhang, L.X., Huang, Y.

Volltext

Degradation mechanisms of AlGaN/GaN HEMTs under 800 MeV Bi ions irradiation von Lei, Z.F., Guo, H.X., Tang, M.H., Zeng, C., Zhang, Z.G., Chen, H., En, Y.F., Huang, Y., Chen, Y.Q., Peng, C.

Volltext

Effects of surface tension and axis stress on piezoelectric behaviors of ferroelectric nanowires von Chen, Y. Q., En, Y. F., Huang, Y., Kong, X. D., Zheng, X. J., Lu, Y. D.

Volltext

Effect of temperature on the electrical properties of a metal-ferroelectric (SrBi sub(2)Ta sub(2)O sub( 9))-insulator (HfTaO)-silicon capacitor von Chen, Y Q, Xu, X B, Lei, Z F, Liao, X Y, Wang, X, Zeng, C, En, Y F, Huang, Y

Volltext

Investigation of electrical properties of individual GaN nanowire-based ferroelectric field effect transistor: Electrical properties of individual GaN NW-based ferroelectric FET von Chen, Y. Q., Xu, X. B., Lu, Y. D., Wang, X., En, Y. F.

Volltext

Muong−2, Dark Matter, and Lepton Flavor Violation in SUSY-GUT’s von E. G ́omez, Mario, Lola, Smaragda, Shafi, Qaisar, Tiwari, Amit, Salih ̈Un, Cem

Volltext