Austempering in low-C steels: microstructure development and nanohardness characterization von Taboada, M. C., Elizalde, M. R., Jorge-Badiola, D.

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Fracture characterization of thin-films by dual tip indentation von Trueba, M., Gonzalez, D., Martínez-Esnaola, J.M., Hernandez, M.T., Pantuso, D., Li, H., Elizalde, M.R., Ocaña, I.

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Assessment of mechanical properties of metallic thin-films through micro-beam testing von Trueba, M., Gonzalez, D., Elizalde, M.R., Martínez-Esnaola, J.M., Hernandez, M.T., Li, H., Pantuso, D., Ocaña, I.

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Fracture characterization of brittle thin-films by membrane testing von Trueba, M., Gonzalez, D., Martínez-Esnaola, J.M., Hernandez, M.T., Pantuso, D., Li, H., Ocaña, I., Elizalde, M.R.

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Thermal slip sources at the extremity and bevel edge of silicon wafers von Tanner, B. K., Wittge, J., Allen, D., Fossati, M. C., Danilwesky, A. N., McNally, P., Garagorri, J., Elizalde, M. R., Jacques, D.

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Contact mechanics: a review and some applications von Atkinson, C., Martínez-Esnaola, J. M., Elizalde, M. R.

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Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging von Danilewsky, A.N., Wittge, J., Croell, A., Allen, D., McNally, P., Vagovič, P., dos Santos Rolo, T., Li, Z., Baumbach, T., Gorostegui-Colinas, E., Garagorri, J., Elizalde, M.R., Fossati, M.C., Bowen, D.K., Tanner, B.K.

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Morphology influence of the oxidation kinetics of carbon nanofibers von Córdoba, J.M., Tamayo-Ariztondo, J., Molina-Aldareguia, J.M., Elizalde, M.R., Odén, M.

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Fracture characterization in patterned thin films by cross-sectional nanoindentation von Ocaña, I., Molina-Aldareguia, J.M., Gonzalez, D., Elizalde, M.R., Sánchez, J.M., Martínez-Esnaola, J.M., Gil Sevillano, J., Scherban, T., Pantuso, D., Sun, B., Xu, G., Miner, B., He, J., Maiz, J.

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Interfacial fracture induced by cross-sectional nanoindentation in metal–ceramic thin film structures von Elizalde, M.R., Sánchez, J.M., Martínez-Esnaola, J.M., Pantuso, D., Scherban, T., Sun, B., Xu, G.

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Dislocation sources and slip band nucleation from indents on silicon wafers von Wittge, J., Danilewsky, A. N., Allen, D., McNally, P., Li, Z., Baumbach, T., Gorostegui-Colinas, E., Garagorri, J., Elizalde, M. R., Jacques, D., Fossati, M. C., Bowen, D. K., Tanner, B. K.

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Predicting the thermal conductivity of composite materials with imperfect interfaces von Marcos-Gómez, D., Ching-Lloyd, J., Elizalde, M.R., Clegg, W.J., Molina-Aldareguia, J.M.

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Mechanical strength assessment of single WC-WC interfaces present in WC-Co hardmetals through micro-beam bending experiments von Elizalde, M.R., Ocaña, I., Alkorta, J., Sánchez-Moreno, J.M.

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Cross-sectional nanoindentation: a new technique for thin film interfacial adhesion characterization von Sánchez, J.M., El-Mansy, S., Sun, B., Scherban, T., Fang, N., Pantuso, D., Ford, W., Elizalde, M.R., Martı́nez-Esnaola, J.M., Martı́n-Meizoso, A., Gil-Sevillano, J., Fuentes, M., Maiz, J.

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Effect of heat treatment of carbon nanofibres on electroless copper deposition von Tamayo-Ariztondo, J., Córdoba, J.M., Odén, M., Molina-Aldareguia, J.M., Elizalde, M.R.

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Hardness of C, CNx and AlN thin films after rapid thermal annealing von BESHKOV, G, VASSILEV, G. P, ELIZALDE, M. R, GOMEZ-ACEBO, T

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The geometry of catastrophic fracture during high temperature processing of silicon von Tanner, B. K., Garagorri, J., Gorostegui-Colinas, E., Elizalde, M. R., Bytheway, R., McNally, P. J., Danilewsky, A. N.

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Interface characterisation and correlation with the creep behaviour of a 2.5D SiC/C/SiC composite von Casas, L, Elizalde, M.R, Martı́nez-Esnaola, J.M

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Mechanical characterization and finite element modelling of lateral spread in rolling of low carbon steels von Esteban, L., Elizalde, M.R., Ocaña, I.

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Real-time X-ray diffraction imaging for semiconductor wafer metrology and high temperature in situ experiments von Danilewsky, A. N., Wittge, J., Hess, A., Cröll, A., Rack, A., Allen, D., McNally, P., dos Santos Rolo, T., Vagovič, P., Baumbach, T., Garagorri, J., Elizalde, M. R., Tanner, B. K.

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