Calculation of charge distributions and minority-carrier injection ratio for high-barrier schottky diodes von Elfsten, B., Tove, P.A.

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Noise Characterization of Avalanche Photodiodes With a Multichannel Pulse Height Analyzer von Seibt, W, Elfsten, B

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Influence of metal sheet resistivity on the IV-characteristics of metal-semiconductor diodes von Elfsten, B., Norde, H., Tove, P.A.

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Parameter sensitivity analysis for computer modelling of metal-semiconductor junctions von Tarnay, K., Elfsten, B., Masszi, F., Tove, P.A.

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CALCULATIONS OF CHARGE DISTRIBUTIONS AND MINORITY-CARRIER INJECTION RATIO FOR HIGH-BARRIER SCHOTTKY DIODES von Elfsten, B, Tove, PA

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Influence of metal sheet resistivity on the I-V-characteristics of metal-semiconductor diodes von ELFSTEN, B, NORDE, H, TOVE, P. A

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