Size-independent stresses in Al thin films thermally strained down to −100 °C von Eiper, E., Keckes, J., Martinschitz, K.J., Zizak, I., Cabié, M., Dehm, G.

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Modification of wetting of copper (Cu) on carbon (C) by plasma treatment and molybdenum (Mo) interlayers von Eisenmenger-Sittner, C., Schrank, C., Neubauer, E., Eiper, E., Keckes, J.

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Rapid determination of stress factors and absolute residual stresses in thin films von Eiper, E., Martinschitz, K. J., Massl, S., Köstenbauer, H., Daniel, R., Fontalvo, G., Mitterer, C., Keckes, J.

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Anisotropic intrinsic and extrinsic stresses in epitaxial wurtzitic GaN thin film on γ-LiAlO2 (100) von EIPER, E, HOFMANN, A, GERLACH, J. W, RAUSCHENBACH, B, KECKES, J

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High-temperature residual stresses in thin films characterized by x-ray diffraction substrate curvature method von Keckes, J., Eiper, E., Martinschitz, K. J., Köstenbauer, H., Daniel, R., Mitterer, C.

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D023 Residual stresses in thin films characterized by the combination of SIN2Ψ and curvate methods: possibilities and limitations von Keckes, J., Martinschitz, K. J., Eiper, E.

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In-Situ X-ray Diffraction as a Tool to Probe Mechanical Phenomena Down to the Nano-Scale von Keckes, J., Eiper, E., Martinschitz, K. J., Boesecke, P., Gindl, W., Dehm, G.

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Size-independent stresses in Al thin films thermally strained down to -100 deg C von Eiper, E, Keckes, J, Martinschitz, K J, Zizak, I, Cabie, M, Dehm, G

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Size-independent stresses in Al thin films thermally strained down to -100 super(o)C von Eiper, E, Keckes, J, Martinschitz, K J, Zizak, I, Cabie, M, Dehm, G

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Anisotropic intrinsic and extrinsic stresses in epitaxial wurtzitic GaN thin film on γ-LiAlO 2 (1 0 0) von Eiper, E., Hofmann, A., Gerlach, J.W., Rauschenbach, B., Keckes, J.

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