Stability indicating assays for the determination of piroxicam—comparison of methods von Bartsch, H, Eiper, A, Kopelent-Frank, H

Volltext

Comparison of analytical methods for investigating the photostability of isoxicam von Bartsch, H, Eiper, A, Habiger, K, Kopelent-Frank, H

Volltext

Erratum to “Stability indicating assays for the determination of piroxicam—comparison of methods”: [J. Pharm. Biomed. Anal. 20 (1999) 531–541] von Bartsch, H, Eiper, A, Kopelent-Frank, H

Volltext

DENSITOMETRTSCHE UNTERSUCHUNGEN ZUR PHOTOSTABILITÄT VON MELOXICAM von Bartsch, H., Eiper, A., Göls, B., Kopelent-Frank, H.

Volltext

X-ray elastic constants determined by the combination of sin2 ψ and substrate-curvature methods von Eiper, Ernst, Martinschitz, Klaus J., Gerlach, Jürgen W., Lackner, Jürgen M., Zizak, Ivo, Darowski, Nora, Keckes, Jozef

Volltext

X-ray elastic constants determined by the combination of sin 2 ψ and substrate-curvature methods von Eiper, Ernst, Martinschitz, Klaus J., Gerlach, Jürgen W., Lackner, Jürgen M., Zizak, Ivo, Darowski, Nora, Keckes, Jozef

Volltext

D023 Residual stresses in thin films characterized by the combination of SIN2Ψ and curvate methods: possibilities and limitations von Keckes, J., Martinschitz, K. J., Eiper, E.

Volltext

Size-independent stresses in Al thin films thermally strained down to −100 °C von Eiper, E., Keckes, J., Martinschitz, K.J., Zizak, I., Cabié, M., Dehm, G.

Volltext

Modification of wetting of copper (Cu) on carbon (C) by plasma treatment and molybdenum (Mo) interlayers von Eisenmenger-Sittner, C., Schrank, C., Neubauer, E., Eiper, E., Keckes, J.

Volltext

Rapid determination of stress factors and absolute residual stresses in thin films von Eiper, E., Martinschitz, K. J., Massl, S., Köstenbauer, H., Daniel, R., Fontalvo, G., Mitterer, C., Keckes, J.

Volltext

In-Situ X-ray Diffraction as a Tool to Probe Mechanical Phenomena Down to the Nano-Scale von Keckes, J., Eiper, E., Martinschitz, K. J., Boesecke, P., Gindl, W., Dehm, G.

Volltext

Method and System for Regulating Plasma Dicing Rates von COBUSSEN JOHANNES, DIJKSTRA CHANTAL CLAUDE, KAMPHUIS HENDRIKUS JOZEF, EIPER ERNST

Volltext bestellen

Anisotropic intrinsic and extrinsic stresses in epitaxial wurtzitic GaN thin film on γ-LiAlO2 (100) von EIPER, E, HOFMANN, A, GERLACH, J. W, RAUSCHENBACH, B, KECKES, J

Volltext

High-temperature residual stresses in thin films characterized by x-ray diffraction substrate curvature method von Keckes, J., Eiper, E., Martinschitz, K. J., Köstenbauer, H., Daniel, R., Mitterer, C.

Volltext

Stress Factors and Absolute Residual Stresses in Thin Films Determined by the Combination of Curvature and sin²ψ Methods von Keckes, Jozef, Martinschitz, Klaus J., Eiper, Ernst

Volltext

Size-independent stresses in Al thin films thermally strained down to -100 deg C von Eiper, E, Keckes, J, Martinschitz, K J, Zizak, I, Cabie, M, Dehm, G

Volltext

Size-independent stresses in Al thin films thermally strained down to -100 super(o)C von Eiper, E, Keckes, J, Martinschitz, K J, Zizak, I, Cabie, M, Dehm, G

Volltext

Stress factors and absolute residual stresses in thin films determined by the combination of curvature and sin2psi methods von Martinschitz, Klaus J, Eiper, Ernst, Keckes, Jozef

Volltext

Anisotropic intrinsic and extrinsic stresses in epitaxial wurtzitic GaN thin film on γ-LiAlO 2 (1 0 0) von Eiper, E., Hofmann, A., Gerlach, J.W., Rauschenbach, B., Keckes, J.

Volltext

Method and system for regulating plasma dicing rates von Dijkstra, Chantal, Eiper, Ernst, Kamphuis, Antonius Hendrikus Jozef, Cobussen, Johannes

Volltext bestellen