Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM von Egerton, R. F

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Phase plates in the transmission electron microscope: operating principles and applications von Malac, Marek, Hettler, Simon, Hayashida, Misa, Kano, Emi, Egerton, Ray F., Beleggia, Marco

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Heteroepitaxial Growth of Gold Nanostructures on Silicon by Galvanic Displacement von Sayed, Sayed Y, Wang, Feng, Malac, Marek, Meldrum, Al, Egerton, Ray F, Buriak, Jillian M

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Local thickness measurement through scattering contrast and electron energy-loss spectroscopy von Zhang, Huai-Ruo, Egerton, Ray F., Malac, Marek

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Vibrational spectroscopy in the electron microscope von Krivanek, Ondrej L., Lovejoy, Tracy C., Dellby, Niklas, Aoki, Toshihiro, Carpenter, R. W., Rez, Peter, Soignard, Emmanuel, Zhu, Jiangtao, Batson, Philip E., Lagos, Maureen J., Egerton, Ray F., Crozier, Peter A.

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Outrun radiation damage with electrons? von Egerton, Ray F

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Properties of Dipole-Mode Vibrational Energy Losses Recorded From a TEM Specimen von Egerton, Ray F., Venkatraman, Kartik, March, Katia, Crozier, Peter A.

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Convenient contrast enhancement by a hole-free phase plate von Malac, Marek, Beleggia, Marco, Kawasaki, Masahiro, Li, Peng, Egerton, Ray F.

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Artefacts Induced on Soft Layer of Hybrid Metallic Nanoparticles in TEM von Qian, Hui, Laurentius, Lars, Egerton, Ray F.

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Radiation damage yields across the carbon 1s excitation edge von Leontowich, Adam F.G., Hitchcock, Adam P., Egerton, Ray F.

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Optical and transient photoconductive properties of pentacene and functionalized pentacene thin films: Dependence on film morphology von Ostroverkhova, Oksana, Shcherbyna, Svitlana, Cooke, David G., Egerton, Ray F., Hegmann, Frank A., Tykwinski, Rik R., Parkin, Sean R., Anthony, John E.

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Gold nanoparticles formed directly on a membrane by ultraviolet light irradiation von Qian, Hui, Shen, Wei-Zheng, Chen, Jian, Kawasaki, Masahiro, Egerton, Ray F.

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Electron Energy-Loss Spectroscopy in the Electron Microscope von Egerton, R. F

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Accurate measurement of relative tilt and azimuth angles in electron tomography: a comparison of fiducial marker method with electron diffraction von Hayashida, Misa, Malac, Marek, Bergen, Michael, Egerton, Ray F, Li, Peng

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Solid-state nanopores of controlled geometry fabricated in a transmission electron microscope von Qian, Hui, Egerton, Ray F.

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Observations of the microscopic growth mechanism of pillars and helices formed by glancing-angle thin-film deposition von Malac, Marek, Egerton, Ray F.

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Low-dose performance of parallel-beam nanodiffraction von Malac, Marek, Beleggia, Marco, Taniguchi, Yoshifumi, Egerton, Ray F., Zhu, Yimei

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Alternative methods of identifying the oxidation of metallic nanoparticles embedded in a matrix von Wang, Feng, Malac, Marek, Egerton, Ray F.

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Interpretation of the postpeak in iron fluorides and oxides von Wang, Feng, Egerton, Ray F., Malac, Marek

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Controlled Growth of Silicon Oxide Nanowires from a Patterned Reagent von Wang, Feng, Malac, Marek, Egerton, Ray F, Meldrum, Alkiviathes, Li, Peng, Freeman, Mark R, Veinot, Jonathan G. C

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