Quartz crystal resonator sensors under lateral field excitation—a theoretical and experimental analysis von Hempel, U, Lucklum, R, Hauptmann, P R, EerNisse, E P, Puccio, D, Diaz, R Fernandez

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Analysis of thickness modes of contoured doubly rotated, quartz resonators von EerNisse, E.P.

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Stress in thermal SiO2 during growth von EerNisse, E. P.

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Survey of quartz bulk resonator sensor technologies von EerNisse, E.P., Ward, R.W., Wiggins, R.B.

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Viscous flow of thermal SiO2 von EerNisse, E. P.

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Quartz Resonators vs Their Environment: Time Base or Sensor? von EerNisse, Errol P.

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Quartz thickness-shear mode pressure sensor design for enhanced sensitivity von Clayton, L.D., EerNisse, E.P.

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Role of integrated lateral stress in surface deformation of He-implanted surfaces von EerNisse, E. P., Picraux, S. T.

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Review of thickness-shear mode quartz resonator sensors for temperature and pressure von EerNisse, E.P., Wiggins, R.B.

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Stress in ion-implanted CVD Si3N4 films von EerNisse, E. P.

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Simultaneous Thin-Film Stress and Mass-Change Measurements Using Quartz Resonators von EerNisse, E. P.

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Sputtering of Au by 45-keV ions for different fluences von EerNisse, E. P.

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Experimental evidence for mode shape influence on acceleration-induced frequency shifts in quartz resonators von EerNisse, E.P., Ward, R.W., Watts, M.H., Wiggins, R.B., Wood, O.L.

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Introduction rates and annealing of defects in ion-implanted SiO2 layers on Si von EerNisse, E. P., Norris, C. B.

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Extension of the double resonator technique von EerNisse, E. P.

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Ionization dilatation effects in fused silica from 2 to 18-keV electron irradiation von Norris, C. B., EerNisse, E. P.

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Modifications of the Double-Ended Tuning Fork Geometry for Reduced Coupling to Its Surroundings: Finite Element Analysis and Experiments von Clayton, L.D., Swanson, S.R., EerNisse, E.P.

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Role of stresses in annealing of ion-implantation damage in Si von Seshan, K., EerNisse, E. P.

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Viscous Shear Flow Model for MOS Device Radiation Sensitivity von EerNisse, E. P., Derbenwick, G. F.

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Quartz resonator frequency shifts computed using the finite element method von Clayton, Larry D., Eernisse, Errol P.

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