Possible applications of lasers in assisted reproductive technologies von Schöpper, B., Ludwig, M., Edenfeld, J., Al-Hasani, S., Diedrich, K.

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Application of a 1.48-μm diode laser for bisecting oocytes into two identical hemizonae for the hemizona assay von Edenfeld, J., Schöpper, B., Sturm, R., Diedrich, K., Al-Hasani, S.

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Application of a 1.48-microm diode laser for bisecting oocytes into two identical hemizonae for the hemizona assay von Edenfeld, J, Schöpper, B, Sturm, R, Diedrich, K, Al-Hasani, S

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Cell lineage specification in the nervous system von Edenfeld, Gundula, Pielage, Jan, Klämbt, Christian

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High speed VLSI digital tester architecture for real-time output timing acquisition, results accumulation, and analysis von Johnson, John C, Nelson, Christopher J, Edenfeld, Donald E

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High speed VLSI digital tester architecture for real-time output timing acquisition, results accumulation, and analysis von EDENFELD DONALD E, JOHNSON JOHN C, NELSON CHRISTOPHER J

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High speed VLSI digital tester architecture for real-time output timing acquisition, results accumulation, and analysis von EDENFELD DONALD E, JOHNSON JOHN C, NELSON CHRISTOPHER J

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A 0.5 mu m CMOS/SOI technology von Edenfeld, A., Wang, L.K., Seliskar, J., Haddad, N.

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Enhanced performance of accumulation mode 0.5 mu m CMOS/SOI operated at 300 K and 85 K von Wang, L.K., Seliskar, J., Bucelot, T., Edenfeld, A., Haddad, N.

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Single event upset hardening of commercial VLSI technology without circuit redesign von BRADY, FREDERICK T, HADDAD, NADIM F, WANG, LI KONG, EDENFELD, ARTHUR R, SPENCER, OLIVER, SELISKAR, JOHN J

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0.5 μm CMOS Device Design and Characterization von Hanafi, H. I., Wordeman, M. R., Wang, L. K., Taur, Y., Sun, J. Y. C., Dennard, R. H., Zicherman, D. S., Rodriguez, M. D., Haddad, N., Edenfeld, A., Polavarapu, M.

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Single event upset hardening of commercial VLSI technology without circuit redesign von BRADY, FREDERICK T, HADDAD, NADIM F, WANG, LI KONG, EDENFELD, ARTHUR R, SPENCER, OLIVER, SELISKAR, JOHN J

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Abhärtung gegen die Auslösung von Einzelereignissen für die VLSI-Technologie ohne die Schaltungen neu zu gestalten von BRADY, FREDERICK T, HADDAD, NADIM F, WANG, LI KONG, EDENFELD, ARTHUR R, SPENCER, OLIVER, SELISKAR, JOHN J

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