Measuring conformability of probabilities von Bravata, D.M., Cottle, R.W., Eaves, B.C., Olkin, I.

Volltext

Probing the sensitivity of electron wave interference to disorder-induced scattering in solid-state devices von Scannell, B.C, Pilgrim, I, See, A.M, Montgomery, R.D, Morse, P.K, Fairbanks, M.S, Marlow, C.A, Linke, H, Farrer, I, Ritchie, D.A, Hamilton, A.R, Micolich, A.P, Eaves, L, Taylor, R.P

Volltext bestellen