Structure and properties of arc evaporated nanoscale TiN/MoN multilayered systems von Pogrebnjak, A.D., Eyidi, D., Abadias, G., Bondar, O.V., Beresnev, V.M., Sobol, O.V.

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Synthesis and characterization of a new (Ti1-yCuy)2(Al1-xCux)C MAX phase solid solution von Aouchiche, L., Eyidi, D., Gauthier-Brunet, V., Nechiche, M., Dubois, S.

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Nickel based catalysts derived from hydrothermally synthesized 1:1 and 2:1 phyllosilicates as precursors for carbon dioxide reforming of methane von Sivaiah, M.V., Petit, S., Beaufort, M.F., Eyidi, D., Barrault, J., Batiot-Dupeyrat, C., Valange, S.

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Origin of the magnetic properties of Fe-implanted 4H-SiC semiconductor von Diallo, L., Fnidiki, A., Lechevallier, L., Juraszek, J., Viret, M., Marteau, M., Eyidi, D., Declémy, A.

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The influence of annealing treatments on the properties of Ag:TiO2 nanocomposite films prepared by magnetron sputtering von Adochite, R.C., Munteanu, D., Torrell, M., Cunha, L., Alves, E., Barradas, N.P., Cavaleiro, A., Riviere, J.P., Le Bourhis, E., Eyidi, D., Vaz, F.

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On the possibility of synthesizing multilayered coatings in the (Ti,Al)N system by RGPP: A microstructural study von El Mouatassim, A., Pac, M.-J., Pailloux, F., Amiard, G., Henry, P., Rousselot, C., Eyidi, D., Tuilier, M.-H., Cabioc'h, T.

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TEM observations of dislocations in plastically deformed diamond von Mussi, A., Eyidi, D., Shiryaev, A., Rabier, J.

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Fe implantation effect in the 6H-SiC semiconductor investigated by Mössbauer spectrometry von Diallo, M. L., Diallo, L., Fnidiki, A., Lechevallier, L., Cuvilly, F., Blum, I., Viret, M., Marteau, M., Eyidi, D., Juraszek, J., Declémy, A.

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Controlled nanostructuration of polycrystalline tungsten thin films von Girault, B., Eyidi, D., Goudeau, P., Sauvage, T., Guerin, P., Bourhis, E. Le, Renault, P.-O.

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Influence of stoichiometry and structure on the optical properties of AlNxOy films von Borges, J, Barradas, N P, Alves, E, Beaufort, M F, Eyidi, D, Vaz, F, Marques, L

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Thermal stability and oxidation behavior of quaternary TiZrAlN magnetron sputtered thin films: Influence of the pristine microstructure von Abadias, G., Saladukhin, I.A., Uglov, V.V., Zlotski, S.V., Eyidi, D.

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Ion beam assisted deposition of TiN–Ni nanocomposite coatings von Akbari, A., Templier, C., Beaufort, M.F., Eyidi, D., Riviere, J.P.

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Electrical properties of AlNxOy thin films prepared by reactive magnetron sputtering von Borges, J., Martin, N., Barradas, N.P., Alves, E., Eyidi, D., Beaufort, M.F., Riviere, J.P., Vaz, F., Marques, L.

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Copper coverage effect on tungsten crystallites texture development in W/Cu nanocomposite thin films von Girault, B., Eyidi, D., Chauveau, T., Babonneau, D., Renault, P.-O., Le Bourhis, E., Goudeau, P.

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Correlation between implantation defects and dopants in Fe-implanted SiC von Declémy, A., Debelle, A., Dupeyrat, C., Thomé, L., Monnet, I., Eyidi, D.

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Fe-implanted 6H-SiC: Direct evidence of Fe3Si nanoparticles observed by atom probe tomography and 57Fe Mössbauer spectroscopy von Diallo, M. L., Lechevallier, L., Fnidiki, A., Lardé, R., Debelle, A., Thomé, L., Viret, M., Marteau, M., Eyidi, D., Declémy, A., Cuvilly, F., Blum, I.

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Kinetics of the 3C-6H polytypic transition in 3C-SiC single crystals: A diffuse X-ray scattering study von Dompoint, D., Boulle, A., Galben-Sandulache, I., Chaussende, D., Hoa, L. T. M., Ouisse, T., Eyidi, D., Demenet, J. L., Beaufort, M. F., Rabier, J.

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Microstructural and conductivity changes induced by annealing of ZnO:B thin films deposited by chemical vapour deposition von David, C, Girardeau, T, Paumier, F, Eyidi, D, Lacroix, B, Papathanasiou, N, Tinkham, B P, Guérin, P, Marteau, M

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Fretting contact study of Ti–6Al–4V/graphite couples in a dry shaft/bearing contact with thrust: Influence of plasma nitriding of the titanium alloy von Sylvestre, M., Zaidi, H., Rivière, J.P., Eyidi, D., Doyen, F.

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Modification of electrical properties induced by annealing of ZnO:B thin films deposited by chemical vapour deposition: Kinetic investigation of evolution von David, C., Paumier, F., Tinkham, B.P., Eyidi, D., Marteau, M., Guérin, P., Girardeau, T.

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