Chemical trends of deep levels in van der Waals semiconductors von Ci, Penghong, Tian, Xuezeng, Kang, Jun, Salazar, Anthony, Eriguchi, Kazutaka, Warkander, Sorren, Tang, Kechao, Liu, Jiaman, Chen, Yabin, Tongay, Sefaattin, Walukiewicz, Wladek, Miao, Jianwei, Dubon, Oscar, Wu, Junqiao

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Author Correction: Chemical trends of deep levels in van der Waals semiconductors von Ci, Penghong, Tian, Xuezeng, Kang, Jun, Salazar, Anthony, Eriguchi, Kazutaka, Warkander, Sorren, Tang, Kechao, Liu, Jiaman, Chen, Yabin, Tongay, Sefaattin, Walukiewicz, Wladek, Miao, Jianwei, Dubon, Oscar, Wu, Junqiao

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Tracking deep-level defects in degrading perovskite solar cells with a multifactorial approach von Biaou, Carlos, Mcphail, Matthew, Eriguchi, Kazutaka, Subramanian, Vivek, Dubon, Oscar

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Searching for New Ferroelectric Materials Using High-Throughput Databases: An Experimental Perspective on BiAlO3 and BiInO3 von Acharya, Megha, Mack, Stephanie, Fernandez, Abel, Kim, Jieun, Wang, Huaiyu, Eriguchi, Kazutaka, Meyers, Derek, Gopalan, Venkatraman, Neaton, Jeffrey, Martin, Lane W

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Evaluation of thermally activated defects behaviors in nitrogen-doped Czochralski silicon single crystals using deep level transient spectroscopy von Kajiwara, Kaoru, Eriguchi, Kazutaka, Fusegawa, Kazuhiro, Mitsugi, Noritomo, Samata, Shuichi, Torigoe, Kazuhisa, Harada, Kazuhiro, Hourai, Masataka, Nishizawa, Shin-ichi

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Temperature-dependent growth of hexagonal and monoclinic gallium sulfide films by pulsed-laser deposition von Eriguchi, Kazutaka, Biaou, Carlos, Das, Sujit, Yu, Kin Man, Wu, Junqiao, Dubon, Oscar D.

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Chemical trends of deep levels in van der Waals semiconductors (vol 11, pg 5373, 2020) von Ci, Penghong, Tian, Xuezeng, Kang, Jun, Salazar, Anthony, Eriguchi, Kazutaka, Warkander, Sorren, Tang, Kechao, Liu, Jiaman, Chen, Yabin, Tongay, Sefaattin, Walukiewicz, Wladek, Miao, Jianwei, Dubon, Oscar, Wu, Junqiao

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Method of evaluating semiconductor substrate and method of manufacturing semiconductor substrate von Eriguchi, Kazutaka, Kubota, Tsuyoshi

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Verfahren zur Bewertung eines Halbleitersubstrats und Verfahren zur Herstellung eines Halbleitersubstrats von Eriguchi, Kazutaka, Kubota, Tsuyoshi

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METHOD OF MANAGING DLTS MEASUREMENT APPARATUS von SASAKI, Syun, ERIGUCHI, Kazutaka

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METHOD OF MANAGING DLTS MEASUREMENT APPARATUS von SASAKI, Syun, ERIGUCHI, Kazutaka

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METHOD OF EVALUATING SEMICONDUCTOR SUBSTRATE AND METHOD OF MANUFACTURING SEMICONDUCTOR SUBSTRATE von ERIGUCHI Kazutaka, KUBOTA Tsuyoshi

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Chemical trends of deep levels in van der Waals semiconductors von Ci, Penghong, Tian, Xuezeng, Kang, Jun, Salazar, Anthony, Eriguchi, Kazutaka, Warkander, Sorren, Tang, Kechao, Liu, Jiaman, Chen, Yabin, Tongay, Sefaattin, Walukiewicz, Wladek, Miao, Jianwei, Dubon, Oscar, Wu, Junqiao

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Method of measuring carbon concentration of silicon sample, method of manufacturing silicon single crystal ingot, silicon single crystal ingot and silicon wafer von Masada, Ayumi, Eriguchi, Kazutaka, Samata, Shuichi, Mitsugi, Noritomo

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METHOD OF EVALUATING CARBON CONCENTRATION OF SILICON SAMPLE, METHOD OF EVALUATING SILICON WAFER MANUFACTURING PROCESS, METHOD OF MANUFACTURING SILICON WAFER, METHOD OF MANUFACTURIN... von SASAKI, Syun, ERIGUCHI, Kazutaka, SAMATA, Shuichi

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Verfahren zur Bewertung der Kohlenstoffkonzentration einer Siliciumprobe, Verfahren zur Bewertung eines Herstellungsprozesses für Siliciumwafer, Verfahren zur Herstellung von Silic... von Sasaki, Syun, Eriguchi, Kazutaka, Samata, Shuichi

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METHOD OF EVALUATING MANUFACTURING PROCESS OF SILICON MATERIAL AND MANUFACTURING METHOD OF SILICON MATERIAL von MITSUGI, Noritomo, MASADA, Ayumi, ERIGUCHI, Kazutaka, SAMATA, Shuichi

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METHOD OF EVALUATING SEMICONDUCTOR SUBSTRATE AND METHOD OF MANUFACTURING SEMICONDUCTOR SUBSTRATE von KUBOTA TSUYOSHI, ERIGUCHI KAZUTAKA

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Method of evaluating semiconductor substrate and method of manufacturing semiconductor substrate von KUBOTA TSUYOSHI, ERIGUCHI KAZUTAKA

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METHOD FOR EVALUATING SILICON WAFER AND USE THEREOF von KUBOTA TSUYOSHI, ERIGUCHI KAZUTAKA

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