Simulation of Carrier Trapping in an Embedded Nanowire and Its Effect in the Nano-EBIC Technique von El Hdiy, A., Ledra, M.

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Simulated Contrast of Two Dislocations von Ledra, M., El Hdiy, A.

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Local electronic transport through InAs/InP(0 0 1) quantum dots capped with a thin InP layer studied by an AFM conductive probe von Troyon, M, Smaali, K, Molinari, M, Hdiy, A El, Saint-Girons, G, Patriarche, G

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Conductive AFM microscopy study of the carrier transport and storage in Ge nanocrystals grown by dewetting von Gacem, K, El Hdiy, A, Troyon, M, Berbezier, I, Ronda, A

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High-resolution scanning near-field EBIC microscopy: Application to the characterisation of a shallow ion implanted p +–n silicon junction von Smaali, K., Fauré, J., El Hdiy, A., Troyon, M.

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The effect of (In, Cu) doping and co-doping on physical properties and organic pollutant photodegradation efficiency of ZnO nanoparticles for wastewater remediation von Ghorbali, R., Essalah, G., Ghoudi, A., Guermazi, H., Guermazi, S., El Hdiy, A., Benhayoune, H., Duponchel, B., Oueslati, A., Leroy, G.

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Ge nanocrystals with highly uniform size distribution deposited on alumina at room temperature by pulsed laser deposition: structural, morphological, and charge trapping properties von Martín-Sánchez, J., Marques, L., Vieira, E. M. F., Doan, Q. T., Marchand, A., El Hdiy, A., Rolo, A. G., Pinto, S. R. C., Ramos, M. M. D., Chahboun, A., Gomes, M. J. M.

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Dependence of interface-state generation on field polarity in metal-oxide-silicon devices of various thicknesses and technologies von El-Hdiy, A, Ziane, Dj, Nebel, F, Vuillaume, D, Jourdain, M

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An unusual nonlinearity in current-voltage curves of a bidimensional electron gas at low temperatures von Khlil, R., El Hdiy, A., Cavanna, A., Laruelle, F., Jin, Y.

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Relaxation of positive charge during bidirectional electric stress on metal–oxide–silicon capacitors von El-Hdiy, A., Ziane, Dj

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Structural, morphological and electronic study of CVD SnO2:Sb films von Haireche, S., Boumeddiene, A., Guittoum, A., El Hdiy, A., Boufelfel, A.

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Positive charge instability during bidirectional stress on metal–oxide–silicon capacitors von Ziane, Dj, El-Hdiy, A.

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Three-dimensional simulation of electron beam induced current collected by a nano-contact: Diffusion and collection analysis von Doan, Q. T., El Hdiy, A., Troyon, M.

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An aluminum-gate metal-oxide-silicon capacitor with a tunnel-thin oxide under the bidirectional electric stress von El Hdiy, A., Khlil, R., Jin, Y., Tyaginov, S. E., Shulekin, A. F., Vexler, M. I.

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Electric bidirectional stress effects on metal–oxide–silicon capacitors von El-Hdiy, A., Ziane, Dj

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Soft breakdown of MOS tunnel diodes with a spatially non-uniform oxide thickness von Khlil, R., El Hdiy, A., Shulekin, A.F., Tyaginov, S.E., Vexler, M.I.

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Electrical methods for estimating the correlation length of insulator thickness fluctuations in MIS tunnel structures von Tyaginov, S.E., Vexler, M.I., El Hdiy, A., Gacem, K., Zaporojtchenko, V.

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Nano-electron beam induced current and hole charge dynamics through uncapped Ge nanocrystals von Marchand, A., El Hdiy, A., Troyon, M., Amiard, G., Ronda, A., Berbezier, I.

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Ge nanocrystals formation on SiO2 by dewetting: application to memory von Szkutnik, P. D., Karmous, A., Bassani, F., Ronda, A., Berbezier, I., Gacem, K., El Hdiy, A., Troyon, M.

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Bidirectional stress on a p-metal–oxide–silicon capacitor von Ziane, Dj, El-Hdiy, A., Salace, G.

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