VThreads: A novel VLIW chip multiprocessor with hardware-assisted PThreads von Chouliaras, V.A., Stevens, D., Dwyer, V.M.

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Analysis of critical-length data from Electromigration failure studies von Dwyer, V.M.

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Bidirectional electromigration failure von Lim, M.K., Chouliaras, V.A., Gan, C.L., Dwyer, V.M.

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Quantifying the benefit of thread and data parallelism for fast motion estimation in MPEG-2 von CHOULIARAS, V. A, AGHA, S, JACOBS, T. R, DWYER, V. M

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A practical depth distribution function for angle-resolved Auger/photoelectron spectroscopy von Dwyer, V.M.

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A confirmation of the double-exponential approximation of the depth distribution function for AES/XPS using reciprocal two-stream methods von Dwyer, V.M.

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Burgers' equation on a branching structure von Bressloff, P.C., Dwyer, V.M., Kearney, M.J.

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Background intensity determination in AES/XPS von Dwyer, V.M., Matthew, J.A.D.

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A confirmation of the double-exponential approximation of the depth distribution function for AES/XPS using reciprocal two-stream methods von Dwyer, V.M.

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The effects of elastic backscattering on the Auger or X-ray photoelectron spectra of solids von Dwyer, V.M., Matthew, J.A.D.

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Latent damage and parametric drift in electrostatically damaged MOS transistors von Tunnicliffe, M.J., Dwyer, V.M., Campbell, D.S.

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Thermal breakdown in GaAs MES diodes von Franklin, A.J., Dwyer, V.M., Campbell, D.S.

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A comparison of electron transport in AES/PES with neutron transport theory von Dwyer, V.M., Matthew, J.A.D.

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Structure of the α phase of Ge(1 1 1) √3 × √3-Pb von Carter, J.N., Dwyer, V.M., Holland, B.W.

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Empirical tight binding cluster method for semiconductor surface structures von Carter, J.N., Dwyer, V.M., Holland, B.W.

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The effect of elastic scattering on the effective inelastic mean free path von Dwyer, V.M., Matthew, J.A.D.

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Empirical tight binding cluster method for semiconductor surface structures von Carter, J.N., Dwyer, V.M., Holland, B.W.

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