One-transistor GaAs MESFET- and JFET-accessed dynamic RAM cells for high-speed medium density applications von Dungan, T.E., Neudeck, P.G., Melloch, M.R., Cooper, J.A.

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Molecular beam epitaxy regrowth by use of ammonium sulfide chemical treatments von MELLOCH, M. R, CARPENTER, M. S, DUNGAN, T. E, LI, D, OTSUKA, N

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Electrical characterization of a JFET-accessed GaAs dynamic RAM cell von Neudeck, P.G., Dungan, T.E., Melloch, M.R., Cooper, J.A.

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A thermal-generation-limited buried-well structure for room-temperature GaAs dynamic RAM's von Dungan, T.E., Cooper, J.A., Melloch, M.R.

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Ion-implanted p-n junction capacitors for GaAs DRAMs von Pabst, J.W., Dungan, T.E., Cooper, J.A., Melloch, M.R.

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Specific Hypotensive and Antihypertensive Ocular Effects of D-Isoproterenol in Rabbits von Seidehamel, R.J., Dungan, K.W., Hickey, T.E.

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Key hot-carrier degradation model calibration and verification issues for accurate AC circuit-level reliability simulation von Wenjie Jiang, Huy Le, Dao, S., Kim, S.A., Stine, B., Chung, J.E., Yu-Jen Wu, Bendix, P., Prasad, S., Kapoor, A., Kopley, T.E., Dungan, T., Manna, I., Marcoux, P., Lifeng Wu, Chen, A., Zhihong Liu

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Digital test circuit design and optimization for AC hot-carrier reliability characterization and model calibration under realistic high frequency stress conditions von Jiang, W., Le, H., Kim, S.A., Chung, J.E., Wu, Y.-J., Bendix, P., Jensen, J., Ardans, R., Prasad, S., Kapoor, A., Kopley, T.E., Dungan, T., Marcoux, P.

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