Improved spectrum simulation for validating SEM-EDS analysis von Statham, P, Penman, C, Duncumb, P

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Systematic discrepancies in Monte Carlo predictions of k -ratios emitted from thin films on substrates von Statham, P, Llovet, X, Duncumb, P

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A Microfocus X-ray Tube Used with Focusing Collimators von Arndt, U. W., Long, J. V. P., Duncumb, P.

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Focusing Mirrors for Use with Microfocus X-ray Tubes von Arndt, U. W., Duncumb, P., Long, J. V. P., Pina, L., Inneman, A.

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Scanning electron probe microanalysis von Duncumb, P.

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Quantitative analysis with the electron microprobe. The first 50 years and beyond von Duncumb, Peter

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Correction procedures in electron probe microanalysis of bulk samples von Duncumb, Peter

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Quantitative analysis with the electron microprobe. The first 50 years and beyond : Plenary lecture von DUNCUMB, P

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Benefits of X-ray spectrum simulation at low energies von DUNCUMB, Peter, STATHAM, Peter J

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The X-ray scanning microanalyser von Duncumb, P

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Electron probe methods of X-ray microanalysis von Duncumb, P

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Electron probe microanalysis von Duncumb, P.

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Recent advances in electron probe microanalysis von Duncumb, P

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Enhanced X-ray emission from extinction contours in a single-crystal gold film von Duncumb, P.

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Correction procedures in electron probe microanalysis of bulk samples von DUNCUMB, P

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Micro-analysis by a Flying-Spot X-Ray Method von COSSLETT, V. E., DUNCUMB, P.

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The present state of quantitative X-ray microanalysis Part 1: Physical basis von Duncumb, P, Shields, P K

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Conference on Electron Probe Microanalysis, Reading, September 1963: Quantitative Analysis and Applications von Duncumb, P, Long, J V P, Melford, D A

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Physics As A Route To Management von Duncumb, P

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Technicians in research and development von Duncumb, P

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