EXTREME: Exploiting Page Table for Reducing Refresh Power of 3D-Stacked DRAM Memory von Ho Hyun Shin, Park, Young Min, Duheon Choi, Byoung Jin Kim, Dae-Hyung Cho, Eui-Young Chung

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Operand-oriented Virtual Memory Support for Near-Memory Processing von Choi, Duheon, Jeong, Taeyang, Yeom, Joonhyeok, Chung, Eui-Young

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Per-Operation Reusability Based Allocation and Migration Policy for Hybrid Cache von Oh, Minsik, Kim, Kwangsu, Choi, Duheon, Lee, Hyuk-Jun, Chung, Eui-Young

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A Study of High-Voltage p-Type MOSFET Degradation Under AC Stress von Lee, Dongjun, Lee, Chiwoo, Lee, Changsub, Hur, Sunghoi, Song, Duheon, Choi, Junghyuk, Choi, Byoungdeog

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Abnormal degradation of high-voltage p-type MOSFET with n+ polycrystalline silicon gate during AC stress von Lee, Dongjun, Joo, Ikhyung, Lee, Changsub, Song, Duheon, Choi, Byoungdeog

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Hot Hole-Induced Device Degradation by Drain Junction Reverse Current von Kim, Kwang-Soo, Song, Juneui, Song, Duheon, Choi, Byoungdeog

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19.5 Three-dimensional 128Gb MLC vertical NAND Flash-memory with 24-WL stacked layers and 50MB/s high-speed programming von Ki-Tae Park, Jin-man Han, Daehan Kim, Sangwan Nam, Kihwan Choi, Min-Su Kim, Pansuk Kwak, Doosub Lee, Yoon-He Choi, Kyung-Min Kang, Myung-Hoon Choi, Dong-Hun Kwak, Hyun-wook Park, Sang-won Shim, Hyun-Jun Yoon, Doohyun Kim, Sang-won Park, Kangbin Lee, Kuihan Ko, Dong-Kyo Shim, Yang-Lo Ahn, Jeunghwan Park, Jinho Ryu, Donghyun Kim, Kyungwa Yun, Joonsoo Kwon, Seunghoon Shin, Dongkyu Youn, Won-Tae Kim, Taehyun Kim, Sung-Jun Kim, Sungwhan Seo, Hyung-Gon Kim, Dae-Seok Byeon, Hyang-Ja Yang, Moosung Kim, Myong-Seok Kim, Jinseon Yeon, Jaehoon Jang, Han-Soo Kim, Woonkyung Lee, Duheon Song, Sungsoo Lee, Kye-Hyun Kyung, Jeong-Hyuk Choi

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Lateral-Extended (LatEx.) active for improvement of data retention time for sub 60nm DRAM era von Sungsam Lee, Jongchul Park, Kwangwoo Lee, Sungho Jang, Junho Lee, Hyunsook Byun, Ilgweon Kim, Yongjin Choi, Myoungseob Shim, Duheon Song, Joosung Park, Taewoo Lee, Dongho Shin, Gyoyoung Jin, Kinam Kim

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Improvement of Hot Hole-Induced Degradation in HV Pmosfets von Lee, Dongjun, Lee, Changsub, Song, Duheon, Choi, Byoung-deog

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The Study of Abnormal Degradation in High-Voltage P-Type Mosfets with N+ Polysilicon Gate during AC Stress von Lee, Dongjun, Lee, Changsub, Hur, Sunghoi, Song, Duheon, Choi, Byoungdeog

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Hot Hole-Induced Device Degradation By Drain Junction Reverse Current von Kim, Kwang-Soo, Song, Juneui, Song, Duheon, Choi, Byoungdeog

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