High spatial resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope von Gao, Chen, Wei, Tao, Duewer, Fred, Lu, Yalin, Xiang, X.-D.

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Electro-optic measurements of the ferroelectric-paraelectric boundary in Ba1−xSrxTiO3 materials chips von Li, Jingwei, Duewer, Fred, Gao, Chen, Chang, Hauyee, Xiang, X.-D., Lu, Yalin

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Quantitative microwave evanescent microscopy von Gao, Chen, Duewer, Fred, Xiang, X.-D.

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Tip–sample distance feedback control in a scanning evanescent microwave microscope von Duewer, Fred, Gao, C., Takeuchi, I., Xiang, X.-D.

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Ellipsoidal and parabolic glass capillaries as condensers for x-ray microscopes von Zeng, Xianghui, Duewer, Fred, Feser, Michael, Huang, Carson, Lyon, Alan, Tkachuk, Andrei, Yun, Wenbing

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Quantitative nonlinear dielectric microscopy of periodically polarized ferroelectric domains von Gao, Chen, Duewer, Fred, Lu, Yalin, Xiang, X.-D.

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Low temperature scanning-tip microwave near-field microscopy of YBa2Cu3O7−x films von Takeuchi, I., Wei, T., Duewer, Fred, Yoo, Y. K., Xiang, X.-D., Talyansky, V., Pai, S. P., Chen, G. J., Venkatesan, T.

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Mammographic quantitative image analysis and biologic image composition for breast lesion characterization and classification von Drukker, Karen, Duewer, Fred, Giger, Maryellen L., Malkov, Serghei, Flowers, Chris I., Joe, Bonnie, Kerlikowske, Karla, Drukteinis, Jennifer S., Li, Hui, Shepherd, John A.

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METHODS AND SYSTEMS FOR REMOVING ARTIFACTS FROM A TOMOSYNTHESIS DATASET von DUEWER, Fred

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METHODS, SYSTEMS, APPARATUSES, AND COMPUTER PROGRAMS FOR PROCESSING TOMOGRAPHIC IMAGES von LASKER, Joseph, DUEWER, Fred, MANDELKERN, Stan

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METHOD AND COMPUTER PROGRAM FOR PROCESSING TOMOGRAPHIC IMAGES von LASKER, Joseph, DUEWER, Fred, MANDELKERN, Stan

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Methods, systems, apparatuses, and computer programs for removing marker artifact contribution from a tomosynthesis dataset von Duewer Fred

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METHODS AND SYSTEMS FOR REMOVING ARTIFACTS FROM A TOMOSYNTHESIS DATASET von DUEWER, Fred

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METHODS, SYSTEMS, APPARATUSES, AND COMPUTER PROGRAMS FOR PROCESSING TOMOGRAPHIC IMAGES von LASKER, Joseph, DUEWER, Fred, MANDELKERN, Stan

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Optimizing X-Ray Inspection for Advanced Packaging Applications von Peterson, Brennan, Kwan, Michael, Duewer, Fred, Reid, Andrew, Brooks, Rhiannon

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Room-temperature electronic phase transitions in the continuous phase diagrams of perovskite manganites von Xiang, X.-D, Yoo, Young-Kook, Duewer, Fred, Yang, Haitao, Yi, Dong, Li, Jing-Wei

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ETHODS, SYSTEMS, APPARATUSES, AND COMPUTER PROGRAMS FOR PROCESSING TOMOGRAPHIC IMAGES von LASKER, Joseph, DUEWER, Fred, MANDELKERN, Stan

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METHODS, SYSTEMS, APPARATUSES, AND COMPUTER PROGRAMS FOR PROCESSING TOMOGRAPHIC IMAGES von LASKER, Joseph, DUEWER, Fred, MANDELKERN, Stan

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Nondestructive Imaging of Dielectric-Constant Profiles and Ferroelectric Domains with a Scanning-Tip Microwave Near-Field Microscope von Lu, Yalin, Wei, Tao, Duewer, Fred, Lu, Yanqing, Ming, Nai-Ben, Schultz, P. G., X.-D. Xiang

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METHODS AND SYSTEMS FOR REMOVING ARTIFACTS FROM A TOMOSYNTHESIS DATASET von DUEWER, Fred

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