Device-design metrics to improve manufacturability von Peterson, Kirk, Logan, Ron, Xiaojun Yu, Dezfulian, Kevin, Bazan, Greg, Winslow, Jon, Zamdmer, Noah, Dubuque, Lenny, Walsh, Brian, Norfleet, Andrew, Clougherty, Fran, Bayat, Ben, Mocuta, Anda, Rim, Ken

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