High-resolution hard-x-ray photoelectron diffraction in a momentum microscope-the model case of graphite von Fedchenko, O, Winkelmann, A, Medjanik, K, Babenkov, S, Vasilyev, D, Chernov, S, Schlueter, C, Gloskovskii, A, Matveyev, Yu, Drube, W, Schönhense, B, Elmers, H J, Schönhense, G

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Origin of electronic localization in metal-insulator transition of phase change materials von Sarkar, I., Perumal, K., Kulkarni, S., Drube, W.

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The new dedicated HAXPES beamline P22 at PETRAIII von Schlueter, C., Gloskovskii, A., Ederer, K., Schostak, I., Piec, S., Sarkar, I., Matveyev, Yu, Lömker, P., Sing, M., Claessen, R., Wiemann, C., Schneider, C. M., Medjanik, K., Schönhense, G., Amann, P., Nilsson, A., Drube, W.

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Hard x-ray photoelectron spectroscopy study of the electroforming in Ti/HfO2-based resistive switching structures von Sowinska, M., Bertaud, T., Walczyk, D., Thiess, S., Schubert, M. A., Lukosius, M., Drube, W., Walczyk, Ch, Schroeder, T.

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Progress in HAXPES performance combining full‐field k‐imaging with time‐of‐flight recording von Medjanik, K., Babenkov, S. V., Chernov, S., Vasilyev, D., Schönhense, B., Schlueter, C., Gloskovskii, A., Matveyev, Yu, Drube, W., Elmers, H. J., Schönhense, G.

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Electronic structure changes across the metamagnetic transition in FeRh via hard X-ray photoemission von Gray, A X, Cooke, D W, Krüger, P, Bordel, C, Kaiser, A M, Moyerman, S, Fullerton, E E, Ueda, S, Yamashita, Y, Gloskovskii, A, Schneider, C M, Drube, W, Kobayashi, K, Hellman, F, Fadley, C S

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Investigation of epitaxial LaNiO3-x thin films by high-energy XPS von MICKEVICIUS, S, GREBINSKIJ, S, BONDARENKA, V, VENGALIS, B, SLIUZIENE, K, ORLOWSKI, B. A, OSINNIY, V, DRUBE, W

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Electronic band alignment and electron transport in Cr/BaTiO3/Pt ferroelectric tunnel junctions von Zenkevich, A., Minnekaev, M., Matveyev, Yu, Lebedinskii, Yu, Bulakh, K., Chouprik, A., Baturin, A., Maksimova, K., Thiess, S., Drube, W.

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Interface Engineering to Create a Strong Spin Filter Contact to Silicon von Caspers, C., Gloskovskii, A., Gorgoi, M., Besson, C., Luysberg, M., Rushchanskii, K. Z., Ležaić, M., Fadley, C. S., Drube, W., Müller, M.

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Bulk sensitive hard x-ray photoemission electron microscopy von Patt, M, Wiemann, C, Weber, N, Escher, M, Gloskovskii, A, Drube, W, Merkel, M, Schneider, C M

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Photoelectron spectroscopy with hard X-rays von Drube, W.

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“Conductive” yttria-stabilized zirconia as an epitaxial template for oxide heterostructures von Caspers, C., Gloskovskii, A., Drube, W., Schneider, C. M., Müller, M.

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Hard x-ray photoelectron spectroscopy of oxide hybrid and heterostructures: a new method for the study of buried interfaces von Claessen, R, Sing, M, Paul, M, Berner, G, Wetscherek, A, Müller, A, Drube, W

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Chemical stability of the magnetic oxide EuO directly on silicon observed by hard x-ray photoemission spectroscopy von Caspers, C., Müller, M., Gray, A. X., Kaiser, A. M., Gloskovskii, A., Fadley, C. S., Drube, W., Schneider, C. M.

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X-ray diffraction study of the ultrathin Al2O3 layer on NiAl(110) von STIERLE, A, RENNER, F, STREITEL, R, DOSCH, H, DRUBE, W, COWIE, B. C

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Analysis of KLL Auger spectra excited by X-rays from Ni and Cu metal surfaces von Egri, S., Kövér, L., Cserny, I., Novák, M., Drube, W.

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Core level photoemission studies on conducting polypyrrole polymer nanotubes showing switching transitions von Sarkar, I., Sarma, A., Sanyal, M. K., Thieß, S., Drube, W.

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Pronounced effects of interchannel coupling in high-energy photoionization von Drube, W, Grehk, T M, Thieß, S, Pradhan, G B, Varma, H R, Deshmukh, P C, Manson, S T

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Raman and fluorescence contributions to the resonant inelastic soft x-ray scattering on LaAlO3/SrTiO3 heterostructures von Pfaff, F, Fujiwara, H, Berner, G, Yamasaki, A, Niwa, H, Kiuchi, H, Gloskovskii, A, Drube, W, Gabel, J, Kirilmaz, O, Sekiyama, A, Miyawaki, J, Harada, Y, Suga, S, Sing, M, Claessen, R

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Probing the interaction between gold nanoparticles and oxygen functionalized carbon nanotubes von Suarez-Martinez, I., Bittencourt, C., Ke, X., Felten, A., Pireaux, J.J., Ghijsen, J., Drube, W., Van Tendeloo, G., Ewels, C.P.

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