Quantitative SIMS depth profiling of Al in AlGaN/AlN/GaN HEMT structures with nanometer‐thin layers von Yunin, P.A., Drozdov, Yu.N., Drozdov, M.N., Khrykin, O.I., Shashkin, V.I.

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SiV center electroluminescence in high current density diamond p-i-n diode von Lobaev, M. A., Radishev, D. B., Vikharev, A. L., Gorbachev, A. M., Bogdanov, S. A., Isaev, V. A., Kraev, S. A., Okhapkin, A. I., Arhipova, E. A., Demidov, E. V., Drozdov, M. N.

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Influence of Mo interlayers on the microstructure of layers and reflective characteristics of Ru/Be multilayer mirrors von Smertin, R M, Chkhalo, N I, Drozdov, M N, Garakhin, S A, Zuev, S Yu, Polkovnikov, V N, Salashchenko, N N, Yunin, P A

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All-epitaxial Al/AlGaN/GaN low-barrier Schottky diodes von Vostokov, N. V., Drozdov, M. N., Kraev, S. A., Lobanov, D. N., Novikov, A. V., Yunin, P. A.

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(Na, Zr) and (Ca, Zr) Phosphate-Molybdates and Phosphate-Tungstates: II-Radiation Test and Hydrolytic Stability von Karaeva, M E, Savinykh, D O, Orlova, A I, Nokhrin, A V, Boldin, M S, Murashov, A A, Chuvil'deev, V N, Skuratov, V A, Issatov, A T, Yunin, P A, Nazarov, A A, Drozdov, M N, Potanina, E A, Tabachkova, N Y

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Low-barrier Mott diodes with near-surface polarization-induced δ-doping von Vostokov, N. V., Drozdov, M. N., Khrykin, O. I., Yunin, P. A., Shashkin, V. I.

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Ultrathin metallic interlayers in vacuum deposited MoOx/metal/MoOx electrodes for organic solar cells von Travkin, V.V., Luk’yanov, A.Yu, Drozdov, M.N., Vopilkin, E.A., Yunin, P.A., Pakhomov, G.L.

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Study of oxidation processes in Mo/Be multilayers von Nechay, A. N., Chkhalo, N. I., Drozdov, M. N., Garakhin, S. A., Pariev, D. E., Polkovnikov, V. N., Salashchenko, N. N., Svechnikov, M. V., Vainer, Yu. A., Meltchakov, E., Delmotte, F.

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Novel microwave plasma-assisted CVD reactor for diamond delta doping von Vikharev, A. L., Gorbachev, A. M., Lobaev, M. A., Muchnikov, A. B., Radishev, D. B., Isaev, V. A., Chernov, V. V., Bogdanov, S. A., Drozdov, M. N., Butler, J. E.

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Microwave microscopy of diamond semiconductor structures von Reznik, A. N., Korolyov, S. A., Drozdov, M. N.

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Effect of the Chloropentafluoroethane Additive in Chlorine-Containing Plasma on the Etching Rate and Etching-Profile Characteristics of Gallium Arsenide von Okhapkin, A. I., Kraev, S. A., Arkhipova, E. A., Daniltsev, V. M., Khrykin, O. I., Yunin, P. A., Drozdov, M. N.

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Sputter depth profiling of Mo/B4C/Si and Mo/Si multilayer nanostructures: A round-robin characterization by different techniques von Ber, B., Bábor, P., Brunkov, P.N., Chapon, P., Drozdov, M.N., Duda, R., Kazantsev, D., Polkovnikov, V.N., Yunin, P., Tolstogouzov, A.

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Plasma Chemical Deposition of Hydrogenated DLC Films with Different Hydrogen and sp3-Hybrid Carbon Content von Okhapkin, A. I., Drozdov, M. N., Yunin, P. A., Kraev, S. A., Radishev, D. B.

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Pulsed Laser Irradiation of Light-Emitting Structures with a (Ga,Mn)As Layer von Zvonkov, B. N., Vikhrova, O. V., Danilov, Yu. A., Demina, P. B., Dorokhin, M. V., Drozdov, M. N., Zdoroveyshchev, D. A., Kalentyeva, I. L., Kuznetsov, Yu. M., Kudrin, A. V., Nezhdanov, A. V., Parafin, A. E., Khomitsky, D. V.

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Quantitative depth profiling of Si1–xGex structures by time-of-flight secondary ion mass spectrometry and secondary neutral mass spectrometry von Drozdov, M.N., Drozdov, Y.N., Csik, A., Novikov, A.V., Vad, K., Yunin, P.A., Yurasov, D.V., Belykh, S.F., Gololobov, G.P., Suvorov, D.V., Tolstogouzov, A.

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Thin film multilayer filters for solar EUV telescopes von Chkhalo, N I, Drozdov, M N, Kluenkov, E B, Kuzin, S V, Lopatin, A Ya, Luchin, V I, Salashchenko, N N, Tsybin, N N, Zuev, S Yu

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Influence of CVD diamond growth conditions on nitrogen incorporation von Lobaev, M.A., Gorbachev, A.M., Bogdanov, S.A., Vikharev, A.L., Radishev, D.B., Isaev, V.A., Chernov, V.V., Drozdov, M.N.

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Effect of antimony doping on the energy of optical transitions in n-Ge layers grown on Si (001) and Ge (001) substrates von Yurasov, D. V., Novikov, A. V., Baidakova, N. A., Aleshkin, V. Ya, Bushuykin, P. A., Andreev, B. A., Yunin, P. A., Drozdov, M. N., Yablonskiy, A. N., Dubinov, A. A., Krasilnik, Z. F.

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A New Approach to TOF-SIMS Analysis of the Phase Composition of Carbon-Containing Materials von Drozdov, M. N., Drozdov, Yu. N., Okhapkin, A. I., Kraev, S. A., Lobaev, M. V.

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Formation of Ohmic Contacts to a Diamond-Like Carbon Layer Deposited on a Dielectric Diamond Substrate von Okhapkin, A. I., Yunin, P. A., Arkhipova, E. A., Kraev, S. A., Korolyov, S. A., Drozdov, M. N., Shashkin, V. I.

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